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Error-detection cell for an integrated processor

  • US 20050022071A1
  • Filed: 07/08/2004
  • Published: 01/27/2005
  • Est. Priority Date: 07/09/2003
  • Status: Active Grant
First Claim
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1. An integrated cell for detecting a disturbance capable of affecting the operation of a processor, comprising:

  • non-volatile storage means for storing at least one value of the verification of an invariant; and

    means for periodically recalculating said value in volatile memory elements, for holding an invariant in normal operation of the processor and for detecting an invariant loss consecutive to the occurrence of a disturbance.

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