Calibration method for a lithographic apparatus and device manufacturing method

• US 20050024643A1
• Filed: 06/21/2004
• Published: 02/03/2005
• Est. Priority Date: 06/26/2003
• Status: Active Grant

• Current Assignee: ASML Netherlands BV (ASML Holding NV)
• Original Assignee: ASML Netherlands BV (ASML Holding NV)
• Inventors: Bleeker, Arno Jan, Lof, Joeri, Van Buel, Henricus Wilhelmus Maria
• Granted Patent: US 7,239,393 B2
• Time in Patent Office: Days
• US Class Current: 356/400
• CPC Class Codes: G03F 7/70291 Addressable masks, e.g. spatial light modulators [SLMs], digital micro-mirror devices [DMDs] or liquid crystal display [LCD] patterning devices
• CPC Class Codes: G03F 9/7011 Pre-exposure scan; original with original holder alignment; Prealignment, i.e. workpiece with workpiece holder
• CPC Class Codes: G03F 9/7019 Calibration

Abstract

A calibration method comprising generating a pattern with an array of individually controllable elements, providing a substrate table with a radiation sensor, using radiation to generate an image of the pattern at the substrate table, moving at least one of the generated pattern and the substrate table relative to each other in order to move the image relative to the sensor, detecting radiation intensity with the sensor, and calculating a calibration establishing a relationship between coordinates of the coordinate system of the array of individually controllable elements and coordinates of the coordinate system of the substrate table, based on the detected intensity and the positions of the array of individually controllable elements and the substrate table.

Claims

1. A calibration method used in a lithographic apparatus, comprising:

(a) generating a pattern with an array of individually controllable elements;

(b) illuminating the array of individually controllable elements with radiation to generate an image of the pattern onto a substrate table having a radiation sensor;

(c) moving at least one of the generated pattern and the substrate table relative to each other in order to move the image relative to the radiation sensor;

(d) detecting radiation intensity with the radiation sensor; and

(e) calculating a calibration value establishing a relationship between coordinates of a coordinate system of the array of individually controllable elements and coordinates of a coordinate system of the substrate table, based on the detected radiation intensity and positions of the array of individually controllable elements and the substrate table.

2. The method of claim 1, wherein steps (b), (c), and (d) are repeated to acquire information for step (e).

3. The method of claim 1, wherein step (c) comprises:

scanning at least one of the generated pattern and the substrate table relative to each other, while continuously performing step (d).

4. The method of claim 1, wherein step (c) comprises one or more of:

moving the pattern generated on the array of individually controllable elements, while keeping the substrate table stationary;

moving the array of individually controllable elements, while keeping the substrate table stationary;

moving the substrate table while keeping the pattern generated on the array of individually controllable elements stationary;

moving the substrate table, while keeping the array of individually controllable elements stationary; and

moving the substrate table and moving at least one of the array of individually controllable elements and the pattern generated on the array of individually controllable elements.

5. The method of claim 1, further comprising:

(f) defining a distance by which the pattern is moved between successive instances of detecting the radiation intensity to be a delta step, wherein a ratio of the delta step to a pixel size of the array of individually controllable elements is not a whole number.

6. The method of claim 1, further comprising:

(f) defining a distance by which the pattern is moved between successive instances of detecting the radiation intensity to be a delta step, wherein when the delta step is less than the pixel size, the ratio of a pixel size to the delta step is not a whole number.

7. The method of claim 1, wherein step (c) comprises:

moving the substrate table and at least one of the array of individually controllable elements and the pattern on the array of individually controllable elements in different directions.

8. The method of claim 7, further comprising using substantially perpendicular directions as the different directions.

9. The method of claim 1, further comprising:

performing steps (a) to (e) using a pattern generated on a first portion of the array of individually controllable elements; and

repeating steps (a) to (e) using a pattern generated on a second portion of the array of individually controllable elements.

10. The method of claim 9, further comprising forming the first and second portions of the array of individually controllable elements, such that they are off-center.

11. The method of claim 9, further comprising forming the first and second portions of the array of individually controllable elements, such that they are on opposite sides of the array of individually controllable elements.

12. The method of claim 1, further comprising:

scanning the substrate table;

generating a trigger signal to trigger a pulse of radiation, which is generated by an illumination system, while the substrate table is scanning;

determining a positional error of the image of the generated pattern resulting from motion of the substrate table between generation of the trigger signal and emission of the pulse of the radiation using step (e); and

calculating radiation delay timing from the positional error.

13. The method of claim 1, wherein step (b) comprises:

using radiation with a wavelength longer than that of a projection beam of radiation provided by another illumination system.

14. The method of claim 1, further comprising:

using a plurality of the array of individually controllable elements;

performing steps (a) to (e) for each array in the plurality of arrays of individually controllable elements; and

displacing the substrate table by a known vector between the calibration for each of the arrays of the plurality of arrays of individually controllable elements.

15. The method of claim 1, further comprising:

using a plurality of the arrays of individually controllable elements;

using a plurality of the radiation sensors; and

performing steps (a) to (e) using a different respective one of the radiation sensors for each respective ones of the arrays of individually controllable elements.

16. The method of claim 1, further comprising:

using an alignment sensor to calibrate coordinates of the substrate table with respect to coordinates of a substrate provided thereon.

17. A device manufacturing method, comprising:

using an array of individually controllable elements to pattern a first beam of radiation;

projecting the patterned first beam of radiation onto a target portion of a substrate, generating a pattern with the array of individually controllable elements;

illuminating the array of individually controllable elements with a second beam of radiation to generate an image of the pattern onto a substrate table having a radiation sensor;

moving at least one of the generated pattern and the substrate table relative to each other in order to move the image relative to the radiation sensor;

detecting radiation intensity with the radiation sensor;

calculating a calibration value establishing a relationship between coordinates of a coordinate system of the array of individually controllable elements and coordinates of a coordinate system of the substrate table, based on the detected radiation intensity and positions of the array of individually controllable elements and the substrate table; and

positioning the substrate and the array of individually controllable elements with respect to each other using the calibration information.

18. A device manufactured according to the method of claim 17.

19. A computer program product for controlling a lithographic apparatus comprising a computer useable medium having a computer program logic recorded thereon for controlling at least one processor, the computer program logic comprising:

computer program code means for generating a pattern with an array of individually controllable elements;

computer program code means for illuminating the array of individually controllable elements with radiation to generate an image of the pattern onto a substrate table having a radiation sensor;

computer program code means for moving at least one of the generated pattern and the substrate table relative to each other in order to move the image relative to the radiation sensor;

computer program code means for detecting radiation intensity with the radiation sensor; and

computer program code means for calculating a calibration value establishing a relationship between coordinates of a coordinate system of the array of individually controllable elements and coordinates of a coordinate system of the substrate table, based on the detected radiation intensity and positions of the array of individually controllable elements and the substrate table.