Microarray scanning
First Claim
Patent Images
1. An apparatus for scanning, comprising:
- a light source emitting a polarized light beam;
an optical assembly having a surface adapted to allow placing thereon a specimen array, the light beam from the light source being reflected by the surface to provide an evanescent field over a portion of the specimen array such that the portion of the specimen array in the evanescent field causes a polarization change in the light beam; and
a detector positioned to detect the polarization change in the light beam as the light beam is scanned over the specimen array.
9 Assignments
0 Petitions
Accused Products
Abstract
Methods and apparatus for scanning of a microarray to provide an image of the microarray are disclosed. Data related to change in polarization state of a scanning light beam for individual points or lines or other portion of the microarray are collected and processed to image the microarray at high resolution and speed.
62 Citations
41 Claims
-
1. An apparatus for scanning, comprising:
-
a light source emitting a polarized light beam;
an optical assembly having a surface adapted to allow placing thereon a specimen array, the light beam from the light source being reflected by the surface to provide an evanescent field over a portion of the specimen array such that the portion of the specimen array in the evanescent field causes a polarization change in the light beam; and
a detector positioned to detect the polarization change in the light beam as the light beam is scanned over the specimen array. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26)
-
-
27. An apparatus for scanning, comprising:
-
a light source emitting a polarized light beam;
an optical assembly having a surface adapted to allow placing thereon a specimen array, the light beam from the light source being reflected by the surface to provide an evanescent field over a portion of the specimen array such that the portion of the specimen array in the evanescent field causes a polarization change in the light beam;
a detector positioned to detect the polarization change in the light beam as the light beam is scanned over the specimen array; and
a processor to process a plurality of signals related to spatially distributed polarization changes to thereby provide feedback for subsequent scanning of the specimen array. - View Dependent Claims (28, 29, 30)
-
-
31. A method of imaging, comprising:
-
passing a polarized light beam into an optical structure for reflection at a surface of the optical structure to provide an evanescent field over a portion of a specimen array, the portion of the specimen array in the evanescent field causing a polarization change in the light beam;
detecting the polarization change in the light beam as the light beam scans the specimen array; and
processing a plurality of signals related to spatially distributed polarization changes to thereby provide an image of the specimen array. - View Dependent Claims (32, 33, 34, 35, 36, 37)
-
-
38. A method of scanning, comprising:
-
passing a polarized light beam into an optical structure for reflection at a surface of the optical structure to provide an evanescent field over a portion of a specimen array, the portion of the specimen array in the evanescent field causing a polarization change in the light beam;
detecting the polarization change in the light beam as the light beam scans the specimen array; and
processing a plurality of signals related to spatially distributed polarization changes to thereby provide feedback for subsequent scanning of the specimen array. - View Dependent Claims (39, 40, 41)
-
Specification