Non-volatile semiconductor memory device and electric device with the same
First Claim
1. A non-volatile semiconductor memory device comprising a cell array in which electrically rewritable and non-volatile memory cells are arranged, and a sense amplifier circuit configured to read and write data in association with said cell array, wherein said sense amplifier circuit comprises:
- a differential amplifier having first and second input nodes and configured to amplify a difference voltage between said first and second input nodes;
a data transfer circuit configured to selectively connect said first input node to a bit line of said cell array;
a reference voltage setting circuit configured to apply a reference voltage to said second input node of said differential amplifier; and
a data storing circuit configured to temporarily hold a loaded write data at said first input node of said differential amplifier, and control the reference voltage at said second input node of said differential amplifier in correspondence with the write data held therein.
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Accused Products
Abstract
A non-volatile semiconductor memory device includes a cell array in which electrically rewritable and non-volatile memory cells are arranged, and a sense amplifier circuit configured to read and write data in association with the cell array, wherein the sense amplifier circuit includes: differential amplifier having first and second input nodes and configured to amplify a difference voltage between the first and second input nodes; a data transfer circuit configured to selectively connect the first input node to a bit line in the cell array; a reference voltage setting circuit configured to apply a reference voltage to the second input node of the differential amplifier; and a data storing circuit configured to temporarily hold a loaded write data at the first input node of the differential amplifier, and control the reference voltage at the second input node of the differential amplifier in correspondence with the write data held therein.
41 Citations
18 Claims
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1. A non-volatile semiconductor memory device comprising a cell array in which electrically rewritable and non-volatile memory cells are arranged, and a sense amplifier circuit configured to read and write data in association with said cell array, wherein
said sense amplifier circuit comprises: -
a differential amplifier having first and second input nodes and configured to amplify a difference voltage between said first and second input nodes;
a data transfer circuit configured to selectively connect said first input node to a bit line of said cell array;
a reference voltage setting circuit configured to apply a reference voltage to said second input node of said differential amplifier; and
a data storing circuit configured to temporarily hold a loaded write data at said first input node of said differential amplifier, and control the reference voltage at said second input node of said differential amplifier in correspondence with the write data held therein. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9)
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10. An electric card equipped with a non-volatile semiconductor memory device, said device comprising a cell array in which electrically rewritable and non-volatile memory cells are arranged, and a sense amplifier circuit configured to read and write data in association with said cell array, wherein said sense amplifier circuit comprises:
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a differential amplifier having first and second input nodes and configured to amplify a difference voltage between said first and second input nodes;
a data transfer circuit configured to selectively connect said first input node to a bit line of said cell array;
a reference voltage setting circuit configured to apply a reference voltage to said second input node of said differential amplifier; and
a data storing circuit configured to temporarily hold a loaded write data at said first input node of said differential amplifier, and control the reference voltage at said second input node of said differential amplifier in correspondence with the write data held therein. - View Dependent Claims (11, 12)
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13. A non-volatile semiconductor memory device comprising a cell array in which electrically rewritable and non-volatile memory cells are arranged, and a sense amplifier circuit configured to read data in association with said cell array, wherein
said sense amplifier circuit comprises: -
a differential amplifier having first and second input nodes and configured to amplify a difference voltage between said first and second input nodes;
a data transfer circuit configured to selectively connect said first input node to a bit line of said cell array; and
a reference voltage setting circuit configured to apply a reference voltage, which serves for determining the bit line data transferred to said first input node, to said second input node of said differential amplifier, said reference voltage being generated based on charge-sharing between said second input node of said differential amplifier and a reference node selectively connected to said second input node, and wherein said data transfer circuit comprises;
a clamping transistor disposed between a bit line of said cell array and a sense node for clamping a bit line voltage and serving as a pre-sense amplifier;
a first precharging transistor connected to said sense node for precharging said sense node and bit line;
a transferring transistor disposed between said sense node and said first input node of said differential amplifier; and
a second precharging transistor connected to said first input node of said differential amplifier for precharging said first input node. - View Dependent Claims (14, 15, 18)
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16. An electric card equipped with a non-volatile semiconductor memory device, said device comprising a cell array in which electrically rewritable and non-volatile memory cells are arranged, and a sense amplifier circuit configured to read data in communication with said cell array, wherein
said sense amplifier circuit comprises: -
a differential amplifier having first and second input nodes and configured to amplify a difference voltage between said first and second input nodes;
a data transfer circuit configured to selectively connect said first input node to a bit line of said cell array; and
a reference voltage setting circuit configured to apply a reference voltage, which serves for determining the bit line data transferred to said first input node, to said second input node of said differential amplifier, said reference voltage being generated based on charge-sharing between said second input node of said differential amplifier and a reference node selectively connected to said second input node, and wherein said data transfer circuit comprises;
a clamping transistor disposed between a bit line of said cell array and a sense node for clamping a bit line voltage and serving as a pre-sense amplifier;
a first precharging transistor connected to said sense node for precharging said sense node and bit line;
a transferring transistor disposed between said sense node and said first input node of said differential amplifier; and
a second precharging transistor connected to said first input node of said differential amplifier for precharging said first input node. - View Dependent Claims (17)
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Specification