Multiple local probe measuring device and method

• US 20050040836A1
• Filed: 09/17/2004
• Published: 02/24/2005
• Est. Priority Date: 09/20/1999
• Status: Active Grant

• Current Assignee: European Molecular Biology Laboratory
• Original Assignee: European Molecular Biology Laboratory
• Inventors: Altmann, Stephan Maximilian, Horber, Johann Karl Heinrich
• Granted Patent: US 6,943,574 B2
• Time in Patent Office: Days
• US Class Current: 850/8
• CPC Class Codes: G01Q 20/02 by optical means
• CPC Class Codes: G01Q 40/00 Calibration, e.g. of probes
• CPC Class Codes: G01Q 70/06 Probe tip arrays
• CPC Class Codes: Y10S 977/863 Atomic force probe
• CPC Class Codes: Y10S 977/869 Optical microscope
• CPC Class Codes: Y10S 977/874 Probe tip array
• CPC Class Codes: Y10S 977/875 with tip detail

Abstract

The invention provides a local probe measuring device for effecting local measurements referring to a sample, comprising a first local probe for local measurements with respect to a sample or a reference surface, a second local probe for local measurements with respect to the sample or the reference surface, a measurement condition adjustment arrangement adapted to commonly adjust a first measurement condition of the first local probe with respect to the sample or the reference surface and a second measurement condition of the second local probe with respect to the sample or the reference surface, a detection arrangement comprising a first detection arrangement associated with the first local probe adapted to independently detect first measurement data referring to local measurements reflected by said first local probe and a second detection arrangement associated with the second local probe adapted to independently detect second measurement data referring to local measurements effected by said second local probe. Further, methods for effecting local measurements and local manipulations by means for multiple local probes are provided.

Claims

1. A local probe measuring device for effecting local measurements referring to a sample, comprising:

a first local probe for local measurements with respect to a sample or a reference surface,

a second local probe for local measurements with respect to the sample or the reference surface,

a rigid mechanical coupling between the first local probe and the second local probe,

a positioning arrangement adapted to commonly adjust distance relations of the probes with respect to the sample or the reference surface to commonly adjust

a first measurement condition of the first local probe with respect to the sample or the reference surface and

a second measurement condition of the second local probe with respect to the sample or the reference surface,

a detection arrangement comprising

a first detection arrangement associated with the first local probe adapted to independently detect first measurement data referring to local measurements effected by said first local probe and

a second detection arrangement associated with the second local probe adapted to independently detect second measurement data referring to local measurements effected by said second local probe,

characterized in that more than two local probes are provided for local measurements with respect to the sample or the reference surface, which are rigidly mechanically coupled with each other and are commonly adjustable by the positioning arrangement.

2. The device according to claim 1, characterized in that said rigid mechanical coupling extends over a coupling path between said local probes having a path length in the order of magnitude as dimensions of the local probes itself.

3. The device according to claim 1, characterized in that said detection arrangement is adapted to independently detect measurement data referring to local measurements effected by each local probe.

4. The device according to claim 3, characterized by provisions to control measurement conditions of one of said local probes on the basis of local measurements effected by at least three other local probes of said local probes, which are arranged around said one local probe.

5. A local probe measuring device for measuring local interactions between a local probe arrangement and a sample, comprising:

a first local probe adapted to interact locally with a sample or a reference surface,

a second local probe adapted to interact locally with the sample or a reference surface,

a rigid mechanical coupling between the first local probe and the second local probe,

a positioning arrangement adapted to commonly adjust

at least one of a first distance of the first local probe with respect to the sample or the reference surface and a first local interaction of the first probe with the sample or the reference surface and

at least one of a second distance of the second local probe with respect to the sample or the reference surface and a second local interaction of the second local probe with the sample or the reference surface,

a detection arrangement comprising

a first detection arrangement associated with the first local probe adapted to detect at least one of the first distance and the first local interaction independently of the second distance and the second local interaction and

a second detection arrangement associated with the second local probe adapted to detect at least one of the second distance and the second local interaction independently of the first distance and the first interaction, characterized in that more than two local probes adapted to interact locally with the sample or the reference surface are provided, which are rigidly mechanically coupled with each other and are commonly adjustable by the positioning arrangement.

6. The device according to claim 5, characterized in that said rigid mechanical coupling extends over a coupling path between said local probes having a path length in the order of magnitude as dimensions of the local probes itself.

7. The device according to claim 5, characterized in that said detection arrangement is adapted to independently detect the distance of each local probe with respect to the sample or the reference surface or the interaction of each local probe with the sample or the reference surface.

8. The device according to claim 7, characterized by provisions to control measurement conditions of one of said local probes via said positioning arrangement on the basis of detection results obtained for at least three other local probes of said local probes, which are arranged around said one local probe.

9. A local probe measuring device for effecting local measurements referring to a sample, comprising:

a first local probe for local measurements with respect to a sample or a reference surface,

a second local probe for local measurements with respect to the sample or the reference surface,

a measurement condition adjustment arrangement adapted to commonly adjust

a first measurement condition of the first local probe with respect to the sample or the reference surface and

a second measurement condition of the second local probe with respect to the sample or the reference surface,

a detection arrangement comprising

a first detection arrangement associated with the first local probe adapted to independently detect first measurement data referring to local measurements effected by said first local probe and

a second detection arrangement associated with the second local probe adapted to independently detect second measurement data referring to local measurements effected by said second local probe,

characterized in that more than two local probes are provided for local measurements with respect to the sample or the reference surface, the measurement conditions of said local probes being commonly adjustable by said measurement condition adjustment arrangement.

10. The device according to claim 9, characterized in that said detection arrangement is adapted to independently detect measurement data referring to local measurements effected by each local probe.

11. The device according to claim 10, characterized by provisions to control measurement conditions of at least one of said local probes via said measurement condition adjustment arrangement on the basis of local measurements effected by at least one other local probe of said local probes.

12. The device according to claim 11, characterized by provisions to control measurement conditions of one of said local probes on the basis of local measurements effected by at least three other local probes of said local probes, which are arranged around said one local probe.