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RF testing method and arrangement

  • US 20050046430A1
  • Filed: 09/03/2003
  • Published: 03/03/2005
  • Est. Priority Date: 09/03/2003
  • Status: Abandoned Application
First Claim
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1. An RF testing method of an electronic device in conjunction with production of the electronic devices, the method comprising:

  • measuring at least one RF property of the electronic device under test using at least one sensor outputting at least one measurement signal, performing comparison between the at least one measurement signal and at least one corresponding reference signal, and determining defectiveness of the electronic device based on the comparison.

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