Process measuring point

• US 20050046838A1
• Filed: 06/25/2002
• Published: 03/03/2005
• Est. Priority Date: 06/28/2001
• Status: Active Grant

• Current Assignee: Endress & Hauser Conducts GmbH & Co., KG.
• Original Assignee: Endress & Hauser Conducts GmbH & Co., KG.
• Inventors: Babel, Wolfgang, Wittmer, Detlev
• Granted Patent: US 7,259,848 B2
• Time in Patent Office: Days
• US Class Current: 356/328
• CPC Class Codes: G01J 3/02 Details
• CPC Class Codes: G01J 3/0291 Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements

Abstract

A process for measuring a point comprising at least one spectrometer and a measuring transducer connected thereto for picking up, processing and forwarding measuring signals from the spectrometer, the spectrometer being arranged in an armature for introduction into a process or a process fluid and the data produced by the spectrometer is used to control a process. The armature comprises a housing for receiving the spectrometer and for securing the armature to a process container containing process fluid and a sensor holder with an inbuilt sensor, interacting with the spectrometer and which is guided in an axially displaceable manner in the armature, whereby the sensor holder protrudes into the process fluid in an extended state.

Claims

1. Process measuring point comprising at least one spectrometer and a measurement transmitter (12) connected therewith for accepting, processing and forwarding measurement signals of the at least one spectrometer, wherein the spectrometer is arranged in an armature (14, 16) for insertion into a process fluid, and the data produced by the spectrometer serve for controlling the process, wherein the armature (14, 16) includes a housing (18, 20) for receiving the spectrometer and for fixing the armature at a process container containing the process fluid, together with a sensor holder with installed sensor (22, 24) interacting with the spectrometer, which sensor is guided axially displaceably in the armature (14, 16) and wherein the sensor holder (22, 24) protrudes into the process fluid in the extended state.

2. Process measuring point as claimed in claim 1, wherein the spectrometer delivers in-situ, in-line and/or continuous measurement signals.

3. Process measuring point as claimed in claim 1, wherein the sensor holder (22, 24) includes a light-guiding device, especially optical waveguides, which serve for the optical coupling of the spectrometer to the process fluid.

4. Process measuring point as claimed in claim 1, wherein the spectrometer is an ATOF-crystal spectrometer or a grating spectrometer.

5. Process measuring point as claimed in claim 1, wherein the coupling to the process occurs by absorption or ATR.

6. Process measuring point as claimed in claim 1, wherein the spectrometer is connected electrically or optically with the measurement transmitter (12).

7. Process measuring point as claimed in claim 1, wherein the sensor holder (22, 24) is located in the retracted position in a cleaning- and/or calibration-position of the sensor in the housing (28, 30).

8. Process measuring point as claimed in claim 1, wherein the spectrometer is exchangeable in the armature (14, 16).

9. Process measuring point as claimed in claim 1, wherein the cleaning- and/or calibration-intervals are controllable by the measurement transmitter (12).

10. Process measuring point as claimed in claim 1, wherein the measurement transmitter (12) is connected with a process control point.

11. Process measuring point as claimed in claim 1, wherein additional sensors are connectable to the measurement transmitter (12).

12. Process measuring point as claimed in claim 1, wherein the use of the same Device Type Manager by both the measurement transmitter (12) and an externally connected PC serves as a means for the joint use of an identical operating surface by both.

13. Process measuring point as claimed in claim 1, wherein the measurement transmitter (12) is connected with an external PC over an interface based on the Field Device Tool-concept.

14. Process measuring point, comprising:

at least one spectrometer which produced data serving to control a process;

a measurement transmitter connected with said at least one spectrometer for accepting, processing and forwarding measurement signals of said at least one spectrometer;

an armature for insertion into a process fluid, said armature having a housing for receiving a spectrometer and for fixing said armature at a process container containing the process fluid, and a sensor holder with installed sensor interacting with a respective spectrometer, which sensor is guided axially displaceably in said armature; and

said sensor holder protrudes into the process fluid in the extended state.

15. The process measuring point as claimed in claim 14, wherein each spectrometer delivers one of:

in-situ, in-line and/or continuous measurement signals.

16. The process measuring point as claimed in claim 14, wherein said sensor holder includes a light-guiding device, especially optical waveguides, which serve for the optical coupling of the spectrometer to the process fluid.

17. The process measuring point as claimed in claim 14, wherein said at least one spectrometer is one of an ATOF-crystal spectrometer and a grating spectrometer.

18. The process measuring point as claimed in claim 16, wherein said optical coupling to the process occurs by one of:

absorption and ATR.

19. The process measuring point as claimed in claim 14, wherein each spectrometer is connected electrically or optically with the measurement transmitter.

20. The process measuring point as claimed in claim 14, wherein said sensor holder is located in the retracted position in a cleaning- and/or calibration-position of the sensor in said housing.

21. The process measuring point as claimed in claim 14, wherein said spectrometer is exchangeable in the armature.

22. The process measuring point as claimed in claim 20, wherein the cleaning- and/or calibration-intervals are controllable by said measurement transmitter.

23. The process measuring point as claimed in claim 14, wherein said measurement transmitter is connected with a process control point.

24. The process measuring point as claimed in claim 14, wherein additional sensors are connectable to said measurement transmitter.

25. The process measuring point as claimed in claim 14, wherein the use of the same Device Type Manager by both said measurement transmitter and an externally connected PC serves as a means for the joint use of an identical operating surface by both.

26. The process measuring point as claimed in claim 14, wherein said measurement transmitter is connected with an external PC over an interface based on the Field Device Tool-concept.