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Non-invasive system and method for diagnosing potential malfunctions of semiconductor equipment components

  • US 20050049834A1
  • Filed: 10/09/2002
  • Published: 03/03/2005
  • Est. Priority Date: 02/27/2001
  • Status: Abandoned Application
First Claim
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1. A system to diagnose potential malfunctions in mechanical components, comprising:

  • a transducer to monitor component vibration of a mechanical component and provide at least one output signal representative of the component vibration;

    a computer system configured to compare the at least one output signal to at least one historical vibration signature and to produce a notification to a user when indicating differences between the at least one output signal and the at least one vibration signature.

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