×

Current density impedance imaging (CDII)

  • US 20050054911A1
  • Filed: 09/03/2004
  • Published: 03/10/2005
  • Est. Priority Date: 09/04/2003
  • Status: Active Grant
First Claim
Patent Images

1. A method of non-invasive imaging of electrical impedance of an object, comprising the steps of:

  • a) making measurements of at least two current density vector fields, J1 and J2, within a region of interest in an object; and

    b) calculating the logarithmic gradient of local conductivity, ∇

    ln σ

    (x, y, z), using a formula

    ln






    σ

    =(

    ×

    J2
    )
    ·

    (J1×

    J2
    )


    J1×

    J2


    2


    J1
    +(

    ×

    J1
    )
    ·

    (J2×

    J1
    )


    J1×

    J2


    2


    J2
    +(

    ×

    J1
    )
    ·

    J2


    J1×

    J2


    2


    J1×

    J2
    (1)
    where {right arrow over (J)}1(x,y,z) and {right arrow over (J)}2 (x,y,z), are the pair of measured nonparallel current densities at point (x,y,z) and ∇

    denotes the gradient operator.

View all claims
  • 0 Assignments
Timeline View
Assignment View
    ×
    ×