Event signature apparatus, systems, and methods
First Claim
Patent Images
1. A method, comprising:
- storing at least one over-voltage condition occurring in an integrated circuit in a non-volatile memory.
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Accused Products
Abstract
An apparatus and a system, as well as a method and article, may operate to compare a circuit operational condition with a specified condition, to record an out-of-specification condition, and to determine some specified number of recorded out-of-specification conditions.
22 Citations
29 Claims
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1. A method, comprising:
storing at least one over-voltage condition occurring in an integrated circuit in a non-volatile memory. - View Dependent Claims (2, 3)
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4. A method, comprising:
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comparing a operational condition with a specified condition;
recording an out-of-specification condition; and
determining a specified number of recorded out-of-specification conditions. - View Dependent Claims (5, 6, 7, 8, 9, 10, 11)
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12. An article comprising a machine-accessible medium having associated data, wherein the data, when accessed, results in a machine performing:
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comparing an operational voltage with a specified voltage;
recording an over-voltage condition; and
determining a specified number of recorded over-voltage conditions. - View Dependent Claims (13, 14, 15, 16)
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17. An apparatus, comprising:
an indelible memory to store a selected number of out-of-specification operational conditions encountered by an electronic circuit. - View Dependent Claims (18, 19, 20, 21)
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22. A system, comprising:
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an indelible memory to store a selected number of out-of-specification operational conditions encountered by an electronic circuit; and
a display coupled to the electronic circuit. - View Dependent Claims (23, 24, 25, 26, 27, 28, 29)
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Specification