Method and apparatus for obtaining simultaneously absorption and refraction images by use of a monochromator with integrated radiation detector

• US 20050069085A1
• Filed: 10/28/2002
• Published: 03/31/2005
• Est. Priority Date: 11/17/2001
• Status: Active Grant

• Current Assignee: UK Research and Innovation
• Original Assignee: Council For The Central Laboratory of The Research Councils
• Inventors: Lewis, Robert
• Granted Patent: US 7,062,015 B2
• Time in Patent Office: Days
• US Class Current: 378/84
• CPC Class Codes: G01N 23/04 and forming images of the material
• CPC Class Codes: G01N 23/20008 Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor monochromators for X- rays using crystals G21K1/06

Abstract

Apparatus for imaging an object (13) irradiated with an X-ray beam (12) by detecting a transmitted X-ray beam transmitted through the object. A crystal analyser (15) receives the transmitted X-ray beam and emits a first diffracted X-ray beam to a detector assembly (14) comprising first and second X-ray detectors (16 and 17). The first detector (16) is a monochromating semiconductor detector which detects a first portion of the first diffracted X-ray beam to generate first image data, and which diffracts a second portion of the first diffracted beam to the second detector (17) which generates second image data. Image processing means (18) are provided for combining the first and second image data to derive a refraction image and an absorption image of the object (13).

Claims

1. Apparatus for imaging an object irradiated with an X-ray beam by detecting a transmitted X-ray beam transmitted through the object, the apparatus comprising:

a crystal analyser for receiving the transmitted X-ray beam and emitting a first diffracted X-ray beam to a detector assembly comprising first and second X-ray detectors, wherein the first detector is a monochromating semiconductor detector which detects a first portion of the first diffracted X-ray beam to generate first image data, and which diffracts a second portion of the first diffracted beam to the second detector which generates second image data, and image processing means are provided for combining the first and second image data to derive a refraction image and an absorption image of the object.

2. Apparatus according to claim 1, wherein the crystal analyser is orientated to maximise the intensity of the first diffracted beam.

3. Apparatus according to claim 1, wherein the crystal analyser is a Bragg or Laue analyser.

4. Apparatus according to claim 3, wherein the crystal analyser is a Bragg type analyser orientated at the Bragg reflection angle with respect to the transmitted X-ray beam.

5. Apparatus according to claim 3, wherein the analyser is a Laue type analyser which emits a forward diffracted X-ray beam in addition to said first diffracted X-ray beam, and further comprising a third detector to detect said forward diffracted X-ray beam and means for deriving a scatter image of the object by combining the first, second and third image data to remove refraction and absorption effects from the third image data.

6. Apparatus according to claim 1, wherein the first detector is orientated so that the first diffracted beam is incident at the first detector at an angle falling on one slope of the detectors rocking curve.

7. Apparatus according to claim 6, wherein the angle of orientation of the first detector relative to the first diffracted beam is ±

Δ

θ

_D/2 where Δ

θ

_D is the full width at half maximum of the rocking curve of the detector.

8. Apparatus according to claim 1, wherein the first detector is a silicon strip detector.

9. Apparatus according to claim 1, wherein the first and second detectors are capable of producing first and second digitised images from said first and second image data.

10. Apparatus according to claim 1, wherein the first and second image data is combined by digitising the first and second image data and comparing and combining it on a pixel-by-pixel basis to form digitised refraction and absorption images.

11. Apparatus according to claim 10, wherein the digitised refraction and absorption images are converted to visual images.

12. Apparatus according to claim 1, wherein the second detector detects the intensity of the incident X-ray beam and the first detector detects the intensity of the first refracted beam minus the second diffracted beam, and said processing means combines the detected intensities for corresponding regions of the object to derive said absorption and refraction images.

13. Apparatus according to claim 1, further comprising means for generating a substantially monoenergetic X-ray beam and directing said X-ray beam at the object.

14. Apparatus according to claim 1, further comprising means for scanning the object with said X-ray beam.

15. A method of imaging an object, the method comprising:

transmitting an X-ray beam through the object;

directing the transmitted X-ray beam at a crystal analyser to produce a first diffracted X-ray beam;

directing the first diffracted X-ray beam at a first detector comprising a monochromating semiconductor detector at an angle of incidence lying on the rocking curve of the detector;

directing a second diffracted beam emitted by the first detector to a second detector;

deriving first image data from X-rays detected at the first detector and second image data from X-rays detected at the second detector; and

combining the first and second image data to derive a refraction image and an absorption image of the object.

16. (Cancelled)

17. (Cancelled)