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Atomic force microscope and method for determining properties of a sample surface using an atomic force microscope

  • US 20050081609A1
  • Filed: 10/17/2003
  • Published: 04/21/2005
  • Est. Priority Date: 10/17/2003
  • Status: Active Grant
First Claim
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1. A method for determining properties of a sample surface using an atomic force microscope, comprising:

  • applying a first voltage between the sample and a probe;

    moving the probe towards the surface of the sample;

    stopping movement of the probe towards the surface of the sample when current in the probe is initially detected; and

    applying a magnetic field to the probe such that the probe obtains stable contact with the surface of the sample.

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