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Methods and apparatus for identification and imaging of specific materials

  • US 20050084069A1
  • Filed: 10/16/2003
  • Published: 04/21/2005
  • Est. Priority Date: 10/16/2003
  • Status: Active Grant
First Claim
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1. A method for analyzing materials in an object, said method comprising:

  • acquiring x-ray projection data of the object at high energy and at low energy for a plurality of views;

    utilizing the acquired x-ray projection data in a material decomposition to determine material densities at each pixel for two selected basis materials;

    determining a composition of an object at each pixel utilizing a determined mapping of material density regions for the two selected basis materials; and

    displaying an image indicative of the composition of the object utilizing the determined composition.

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