Methods and apparatus for identification and imaging of specific materials
First Claim
Patent Images
1. A method for analyzing materials in an object, said method comprising:
- acquiring x-ray projection data of the object at high energy and at low energy for a plurality of views;
utilizing the acquired x-ray projection data in a material decomposition to determine material densities at each pixel for two selected basis materials;
determining a composition of an object at each pixel utilizing a determined mapping of material density regions for the two selected basis materials; and
displaying an image indicative of the composition of the object utilizing the determined composition.
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Abstract
A method for analyzing materials in an object includes acquiring x-ray projection data of the object at high energy and at low energy for a plurality of views. The acquired x-ray projection data is utilized in a material decomposition to determine material densities at each pixel for two selected basis materials. A composition of an object at each pixel is determined utilizing a determined mapping of material density regions for the two selected basis materials. An image indicative of the composition of the object is displayed utilizing the determined composition.
80 Citations
27 Claims
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1. A method for analyzing materials in an object, said method comprising:
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acquiring x-ray projection data of the object at high energy and at low energy for a plurality of views;
utilizing the acquired x-ray projection data in a material decomposition to determine material densities at each pixel for two selected basis materials;
determining a composition of an object at each pixel utilizing a determined mapping of material density regions for the two selected basis materials; and
displaying an image indicative of the composition of the object utilizing the determined composition. - View Dependent Claims (2, 3, 4, 5, 6, 7)
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8. A method for analyzing materials in an object, said method comprising:
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acquiring x-ray projection data of the object at high energy and at low energy for a plurality of views;
utilizing the acquired x-ray projection data in a material decomposition to determine material densities at each pixel for two selected basis materials;
utilizing a determined mapping of material density regions for the two selected basis materials, filtering pixels of an image of the object corresponding to one or more compositions of interest; and
displaying an image indicative of the locations of composition of interest of the object. - View Dependent Claims (9, 10, 11, 12, 13, 14, 15)
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16. An apparatus for analyzing materials in an object, said apparatus comprising an x-ray source and a detector configured to acquire projection data at high and low energies for a plurality of views, a computer, a storage device, and a display, said apparatus configured to:
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acquire x-ray projection data of the object at high energy and at low energy for a plurality of views utilizing said x-ray source and said detector;
process the acquired x-ray projection data utilizing said computer and said storage device to determine material densities at each pixel for two selected basis materials;
determine a composition of an object at each pixel utilizing said computer and a determined mapping of material density regions for the two selected basis materials in said storage device; and
utilize said display to display an image indicative of the composition of the object utilizing the determined composition. - View Dependent Claims (17, 18, 19, 20, 21)
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22. An apparatus for analyzing materials in an object, said apparatus comprising an x-ray source and a detector configured to acquire projection data at high and low energies for a plurality of views, a computer, a storage device, and a display, said apparatus configured to:
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acquire x-ray projection data of the object at high energy and at low energy for a plurality of views utilizing said x-ray source and said detector;
process the acquired x-ray projection data utilizing said computer and said storage device to determine material densities at each pixel for two selected basis materials; and
utilize said computer and a determined mapping of material density regions for the two selected basis materials in said storage device to filter pixels of an image of the object corresponding to one or more compositions of interest; and
utilize said display to display an image indicative of the locations of composition of interest of the object. - View Dependent Claims (23, 24, 25, 26, 27)
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Specification