DAISY CHAIN GANG TESTING
First Claim
1. A method for testing an integrated circuit package having a plurality of daisy chain loops, each daisy chain connected to a pair of package pads, wherein adjacent daisy chain loops are oppositely biased, the method comprising:
- (a) forming a first plurality of gangs of electrically coupled daisy chain loops having a first bias;
(b) forming a second plurality of gangs of electrically coupled daisy chain loops having a second bias;
(c) individually coupling each one of the first plurality of gangs to an electrical measurement device;
(d) electrically coupling the second plurality of gangs in common, forming a common gang, and coupling the common gang to the electrical measurement device; and
(e) using the electrical measurement device to indicate whether there is any leakage between one or more of the first plurality of gangs and the common gang, thereby eliminating the need to use an ATE tester and device under test (DUT) circuit board to perform reliability tests.
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Accused Products
Abstract
A method and system for testing an integrated circuit package is disclosed. The integrated circuit package includes a plurality of daisy chain loops that are connected to a pair of package pads, wherein adjacent daisy chain loops are oppositely biased. Aspects of the present invention include forming a first plurality of gangs of electrically coupled daisy chain loops having a first bias and forming a second plurality of gangs of electrically coupled daisy chain loops having a second bias. Each one of the first plurality of gangs is individually coupled to an electrical measurement device, while the second plurality of gangs are electrically coupled in common, and the common gang is coupled to the electrical measurement device. According to the method and system disclosed herein, the electrical measurement device may be used to indicate whether there is any leakage between one or more of the first plurality of gangs and the common gang, thereby eliminating the need to use an ATE tester and device under test (DUT) circuit board to perform reliability tests.
12 Citations
20 Claims
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1. A method for testing an integrated circuit package having a plurality of daisy chain loops, each daisy chain connected to a pair of package pads, wherein adjacent daisy chain loops are oppositely biased, the method comprising:
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(a) forming a first plurality of gangs of electrically coupled daisy chain loops having a first bias;
(b) forming a second plurality of gangs of electrically coupled daisy chain loops having a second bias;
(c) individually coupling each one of the first plurality of gangs to an electrical measurement device;
(d) electrically coupling the second plurality of gangs in common, forming a common gang, and coupling the common gang to the electrical measurement device; and
(e) using the electrical measurement device to indicate whether there is any leakage between one or more of the first plurality of gangs and the common gang, thereby eliminating the need to use an ATE tester and device under test (DUT) circuit board to perform reliability tests. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A reliability testing system for testing integrated circuit packages, comprising:
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a test package mounted to a test socket wherein the test package includes an array of pads in which pairs of the pads are connected to form daisy chain loops, wherein adjacent lines of the daisy chain loops alternate between having a first bias and a second bias;
a gang testing board on which the test package and the test socket are mounted, the gang testing board including, a first edge card connector, a second edge card connector, and wire fingers, wherein the wire fingers are coupled to the pads of the test package such that multiple gangs of daisy chain loops having the first bias are coupled to the first edge card connector, and multiple gangs of daisy chain loops having the second bias are coupled to the second edge card connector;
an electrical measuring device coupled to the first and second edge card connectors for measuring cumulative leakage between the adjacent lines of the daisy chain loops, wherein the first edge card connector individually couples each one of the gangs having the first bias to the electrical measuring device, and the second edge card connector electrically shorts each of the gangs having the second bias to form a common gang, and the common gang is coupled to the electrical measuring device; and
wherein the electrical measuring device indicates whether there is any leakage between one or more of the gangs having a first bias and the common gang, thereby eliminating the need to use an ATE tester and device under test (DUT) circuit board to perform reliability tests. - View Dependent Claims (13, 14, 15, 16, 17, 18, 19, 20)
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Specification