Apparatus for generating internal voltage capable of compensating temperature variation

• US 20050093581A1
• Filed: 12/24/2003
• Published: 05/05/2005
• Est. Priority Date: 10/31/2003
• Status: Abandoned Application

• Current Assignee: Hynix Semiconductor Incorporated (SK Hynix Inc.)
• Original Assignee: Hynix Semiconductor Incorporated (SK Hynix Inc.)
• Inventors: Kang, Dong-Keum
• Application Number:
  US10/745,861
• Publication Number:
  US 20050093581A1
• Time in Patent Office: Days
• US Class Current: 327/73
• CPC Class Codes: G05F 3/245 producing a voltage or current as a predetermined function of the temperature

Abstract

An apparatus for generating an internal voltage includes a comparing unit for comparing voltage levels between a reference voltage and a comparison voltage, a current supplying unit for outputting a current to an output terminal in response to an output signal of the comparing unit, and a voltage dividing unit for outputting the comparison voltage by dividing a voltage of the output terminal in a selected dividing ratio from a plurality of dividing ratios in response to a selection signal.

Claims

1. An apparatus for generating an internal voltage, comprising:

a comparing unit for comparing voltage levels between a reference voltage and a comparison voltage;

a current supplying unit for outputting a current to an output terminal in response to an output signal of the comparing unit; and

a voltage dividing unit for outputting the comparison voltage by dividing a voltage of the output terminal in a selected dividing ratio from a plurality of dividing ratios in response to a selection signal.

2. The apparatus as recited in claim 1, wherein the voltage dividing unit includes:

a first voltage falling unit coupled to the output terminal;

a plurality of second voltage falling units coupled to the first voltage falling unit, each having different resistance value; and

a plurality of switching units for selectively enabling the second voltage falling units.

3. The apparatus as recited in claim 2, wherein the first voltage falling unit includes a PMOS transistor, which is coupled between the output terminal and the comparison voltage, whose gate is coupled to a ground voltage.

4. The apparatus as recited in claim 3, wherein the second voltage falling unit includes a first NMOS transistor diode-coupled to the comparison voltage.

6. The apparatus as recited in claim 2, wherein the first voltage falling unit includes a first resistor coupled between the output terminal and the comparison voltage.

7. The apparatus as recited in claim 6, wherein the second voltage falling unit includes a second resistor coupled to the comparison voltage.

8. The apparatus as recited in claim 7, wherein the switching unit, which is coupled between the second resistor and the ground voltage, includes an NMOS transistor whose gate receives the selection signal corresponding to the second voltage falling unit.

9. The apparatus as recited in claim 2, wherein the comparing unit includes a differential amplifier of a current mirror type receiving the reference voltage and the comparison voltage.

10. The apparatus as recited in claim 1, wherein the current supplying unit, which is coupled between the power supply voltage and the output terminal, includes a PMOS transistor whose gate receives an output signal of the comparing unit.

5. The apparatus as recited in claim 5, wherein the switching unit, which is coupled between the first NMOS transistor and the ground voltage, includes a second NMOS transistor whose gate receives the selection signal corresponding to the second voltage falling unit.