Semiconductor device and display device
First Claim
1. A semiconductor device, wherein in a deficient defect portion of a plurality of line patterns formed over a same substrate and set to a same potential, ends of a deficiency are connected to each other with a pattern of a conductive material for repair and a line pattern adjacent to the line pattern in which the deficient defect occurs and the deficient defect portion are connected to each other with a pattern of a conductive material for repair.
1 Assignment
0 Petitions
Accused Products
Abstract
In a deficient defect (disconnection) portion of, for example, power supply lines formed on a same substrate and set to a same potential, ends of the disconnection and power supply lines adjacent to the power supply line in which disconnection occurs are connected by a same repair line. The repair line pattern can be formed, for example, through a drawing process by scanning a formation region of the repair line pattern with a laser beam in a gas atmosphere of a conductive material such as tungsten. By connecting the repair line pattern to not only the disconnection portion, but also to adjacent power supply lines, the line resistance can be reduced and flatness over the repair line pattern can be improved.
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Citations
22 Claims
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1. A semiconductor device, wherein
in a deficient defect portion of a plurality of line patterns formed over a same substrate and set to a same potential, ends of a deficiency are connected to each other with a pattern of a conductive material for repair and a line pattern adjacent to the line pattern in which the deficient defect occurs and the deficient defect portion are connected to each other with a pattern of a conductive material for repair.
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10. A display device comprising:
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a plurality of pixels each having a display element and a plurality of line patterns for supplying power to the plurality of pixels from a same power supply, wherein in a deficient defect portion of the line pattern, ends of the deficiency are connected to each other with a pattern of a conductive material for repair and a line pattern adjacent to the line pattern in which the deficient defect occurs and the deficient defect portion are connected to each other with a pattern of a conductive material for repair. - View Dependent Claims (11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22)
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Specification