Sensor platform, apparatus incorporating the platform and process using the platform
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Accused Products
Abstract
A sensor platform for use in sample analysis comprises a substrate (30) of refractive index (n1) and a thin, optically transparent layer (32) of refractive index (n2) on the substrate, (n2 is greater than (n1). The platform incorporates one or multiple corrugated structures in the form of periodic grooves (31), (33), which defines one or more sensing areas each for one or more capture elements. The grooves are so profiled, dimensioned and oriented that when coherent light is incident on the platform it is diffracted into individual beams or diffraction order resulting in reduction of the transmitted beam and an abnormal high reflection of the incident light thereby creates an enhanced evanescent field at the surface of the or each sensing area. The amplitude of this field at the resonant condition is greater by an order of approximately 100 than the field of prior art platforms so that the luminescence intensity created from samples on the platform is also increased by a factor of 100. Also disclosed are an apparatus incorporating the platform and a method of using the platform. Further increases of amplitude have been detected by using light having a linear component which gives rise to TM excitation and/or irradiating the platform from the substrate side.
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Citations
49 Claims
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1-13. -13. (canceled)
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14. Apparatus for analysing samples comprising a platform including an optically transparent substrate having a refractive index (n1), a thin, optically transparent layer, formed on one surface of the substrate, said layer having a refractive index (n2) which is greater than (n1), said platform incorporating therein one or multiple corrugated structures comprising periodic grooves which define one or multiple sensing regions, said grooves being configured such that either
a) coherent light incident on said platform is diffracted into individual beams or diffraction orders which interfere resulting in reduction of the transmitted beam and an abnormal high reflection of the incident light thereby generating an enhanced evanescent field at the surface of the one or multiple sensing regions; - or
b) coherent and linearly polarized light incident on said platform is diffracted into individual beams or diffraction orders which interfere resulting in almost total extinction of the transmitted beam and an abnormal high reflection of the incident light thereby generating an enhanced evanescent field at the surface of the one or multiple sensing regions, wherein the enhanced evanescent field interacts with luminescent material on or in the vicinity of one or more of the sensing regions so as to produce a detectable luminescent signal;
said apparatus further including means for generating a light beam and for directing the beam so that it is incident upon the platform on the side of the substrate that does not have the optically transparent layer disposed thereon at an angle which causes evanescent resonance to occur in at least one sensing region of the platform to thereby create an enhance resonant field in the at least one sensing region of the platform and mean for detecting a characteristic of an affinity reaction occurring on or in the vicinity of, or a characteristic of a material disposed on or in the vicinity of, the at least one sensing region of the platform. - View Dependent Claims (15, 16, 17, 18, 29, 30, 31, 45, 46, 47, 48, 49)
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19-25. -25. (canceled)
- 26. A platform for use in sample analysis, said platform having one or more sensing areas or regions, each for receiving a capture element or elements which when the platform is irradiated with coherent light can interact to provide an indication of an affinity reaction, wherein each capture element includes two or more types of capture molecule.
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27-28. -28. (canceled)
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32. Apparatus for analysing samples comprising a platform including an optically transparent substrate having a refractive index (n1), a thin, optically transparent layer, formed on one surface of the substrate, said layer having a refractive index (n2) which is greater than (n1), said platform incorporating therein one or multiple corrugated structures comprising periodic grooves which define one or multiple sensing regions, said grooves being configured such that either
a) coherent light incident on said platform is diffracted into individual beams or diffraction orders which interfere resulting in reduction of the transmitted beam and an abnormal high reflection of the incident light thereby generating an enhanced evanescent field at the surface of the one or multiple sensing regions; - or
b) coherent and linearly polarized light incident on said platform is diffracted into individual beams or diffraction orders which interfere resulting in almost total extinction of the transmitted beam and an abnormal high reflection of the incident light thereby generating an enhanced evanescent field at the surface of the one or multiple sensing regions, wherein the enhanced evanescent field interacts with luminescent material on or in the vicinity of one or more of the sensing regions so as to produce a detectable luminescent signal;
said apparatus further including means for generating a light beam and for directing the beam so that it is incident upon the platform on the side of the substrate having the optically transparent layer disposed thereon at an angle which causes evanescent resonance to occur in at least one sensing region of the platform to thereby create an enhanced resonant field in the at least one sensing region of the platform, and means for detecting a characteristic of an affinity reaction occurring on or in the vicinity of, or a characteristic of a material disposed on or in the vicinity of, the at least one sensing region of the platform, wherein the light generating means is adapted to generate light having a linear polarisation component which gives rise to TM excitation. - View Dependent Claims (33)
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34. Apparatus for analysing samples comprising a platform including an optically transparent substrate having a refractive index (n1), a thin, optically transparent layer, formed on one surface of the substrate, said layer having a refractive index (n2) which is greater than (n1), said platform incorporating therein one or multiple corrugated structures comprising periodic grooves which define one or multiple sensing regions, said grooves being configured such that either
a) coherent light incident on said platform is diffracted into individual beams or diffraction orders which interfere resulting in reduction of the transmitted beam and an abnormal high reflection of the incident light thereby generating an enhanced evanescent field at the surface of the one or multiple sensing regions; - or
b) coherent and linearly polarized light incident on said platform is diffracted into individual beams or diffraction orders which interfere resulting in almost total extinction of the transmitted beam and an abnormal high reflection of the incident light thereby generating an enhanced evanescent field at the surface of the one or multiple sensing regions, wherein the enhanced evanescent field interacts with luminescent material on or in the vicinity of one or more of the sensing regions so as to produce a detectable luminescent signal;
said apparatus further including means for generating a light beam and for directing the beam so that it is incident upon the platform on the side of the substrate having the optically transparent layer disposed thereon at an angle which causes evanescent resonance to occur in at least one sensing region of the platform to thereby create an enhanced resonant field in the at least one sensing region of the platform, and means for detecting a characteristic of an affinity reaction occurring on or in the vicinity of, or a characteristic of a material disposed on or in the vicinity of, the at least one sensing region of the platform, wherein the light beam incident upon the platform has a polarization that is substantially perpendicular to the grooves in the at least one sensing region so as to give rise to TM excitation in the at least one sensing region.
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35. Apparatus for analysing samples comprising a platform including an optically transparent substrate having a refractive index (n1), a thin, optically transparent layer, formed on one surface of the substrate, said layer having a refractive index (n2) which is greater than (n1), said platform incorporating therein one or multiple corrugated structures comprising periodic grooves which define one or multiple sensing regions, said grooves being configured such that either
a) coherent light incident on said platform is diffracted into individual beams or diffraction orders which interfere resulting in reduction of the transmitted beam and an abnormal high reflection of the incident light thereby generating an enhanced evanescent field at the surface of the one or multiple sensing regions; - or
b) coherent and linearly polarized light incident on said platform is diffracted into individual beams or diffraction orders which interfere resulting in almost total extinction of the transmitted beam and an abnormal high reflection of the incident light thereby generating an enhanced evanescent field at the surface of the one or multiple sensing regions, wherein the enhanced evanescent field interacts with luminescent material on or in the vicinity of one or more of the sensing regions so as to produce a detectable luminescent signal;
said apparatus further including means for generating a light beam and for directing the beam so that it is incident upon the platform on the side of the substrate having the optically transparent layer disposed thereon at an angle which causes evanescent resonance to occur in at least one sensing region of the platform to thereby create an enhanced resonant field in the at least one sensing region of the platform, and means for detecting a characteristic of an affinity reaction occurring on or in the vicinity of, or a characteristic of a material disposed on or in the vicinity of, the at least one sensing region of the platform, wherein the light beam incident upon the platform has a polarization that is substantially parallel to the grooves in the at least one sensing region so as to give rise to TE excitation in the at least one sensing region.
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36. A platform for use in sample analysis comprising an optically transparent substrate having a refractive index (n1), a thin, optically transparent layer, formed on one surface of the substrate, said layer having a refractive index (n2) which is greater than (n1), said platform incorporating therein one or multiple corrugated structures, each comprising substantially parallel periodic grooves which define one or multiple sensing regions, said grooves being configured such that coherent and linearly polarized light incident on said platform is diffracted into individual beams or diffraction orders which interfere resulting in a substantially total extinction of the transmitted beam and an abnormal high reflection of the incident light thereby generating an enhanced evanescent field at the surface of the one or multiple sensing regions;
wherein the enhanced evanescent field interacts with luminescent material on or in the vicinity of one or more of the sensing regions so as to produce a luminescent signal, and wherein a light beam incident upon the platform having a polarization that is substantially perpendicular to the grooves in at least one sensing region gives rise to TM excitation in the at least one sensing region.
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37. A platform for use in sample analysis comprising an optically transparent substrate having a refractive index (n1), a thin, optically transparent layer, formed on one surface of the substrate, said layer having a refractive index (n2) which is greater than (n1), said platform incorporating therein one or multiple corrugated structures, each comprising substantially parallel periodic grooves which define one or multiple sensing regions, said grooves being configured such that coherent and linearly polarized light incident on said platform is diffracted into individual beams or diffraction orders which interfere resulting in a substantially total extinction of the transmitted beam and an abnormal high reflection of the incident light thereby generating an enhanced evanescent field at the surface of the one or multiple sensing regions;
wherein the enhanced evanescent field interacts with luminescent material on or in the vicinity of one or more of the sensing regions so as to produce a luminescent signal, and wherein a light beam incident upon the platform having a polarization that is substantially parallel to the grooves in at least one sensing region gives rise to TE excitation in the at least one sensing region.
Specification