Module-testing device
First Claim
Patent Images
1. A module-testing device for testing a module, comprising:
- at least one module control circuit including a first programmable logic device, said at least one module control circuit feeding a testing control signal to the module;
an I/O port for transmitting a signal to and receiving a signal from an external device;
a first wiring pattern circuit including a second programmable logic device, the first wiring pattern circuit including at least part of a wiring between said at least one module control circuit and the I/O port; and
a configuration circuit for constructing circuit configurations of said at least one module control circuit and the first wiring pattern circuit on the basis of input information.
1 Assignment
0 Petitions
Accused Products
Abstract
A wiring pattern circuit includes part of wiring between a module control circuit and a module. Since the wiring pattern circuit includes a PLD, the wiring thereof can be variably configured in accordance with the specifications of the module control circuit and the module. The construction of the module control circuit can be therefore facilitated. In addition, since a printed wiring pattern does not have to be provided separately for the test of each of a plurality of different modules, the test period, the labor and the cost involved during the test can be decreased.
-
Citations
20 Claims
-
1. A module-testing device for testing a module, comprising:
-
at least one module control circuit including a first programmable logic device, said at least one module control circuit feeding a testing control signal to the module;
an I/O port for transmitting a signal to and receiving a signal from an external device;
a first wiring pattern circuit including a second programmable logic device, the first wiring pattern circuit including at least part of a wiring between said at least one module control circuit and the I/O port; and
a configuration circuit for constructing circuit configurations of said at least one module control circuit and the first wiring pattern circuit on the basis of input information. - View Dependent Claims (2, 3, 4, 5, 6, 7, 10, 11, 12, 13, 14)
-
-
8. A test board for use with a module-testing device, the test board comprising:
-
a substrate;
a configuration circuit provided at one end of the substrate;
an I/O port provided at the other end of the substrate;
module control circuits arranged in a two-by-two matrix on the substrate between the configuration circuit and the I/O port;
a plurality of first wiring pattern circuits, at least two of the plurality of first wiring pattern circuits being provided between a respective one of the module control circuits and the I/O port; and
a plurality of second wiring pattern circuits sandwiched between two adjacent ones of the module control circuits. - View Dependent Claims (9, 15, 16, 17)
-
-
18. A module-testing device for testing a module, comprising:
-
at least one module control circuit feeding a testing control signal to the module;
an I/O port for transmitting a signal to and receiving a signal from an external device;
a wiring pattern circuit including a programmable logic device; and
a configuration circuit for constructing circuit configurations of said at least one module control circuit and the wiring pattern circuit on the basis of input information input via the I/O port. - View Dependent Claims (19, 20)
-
Specification