Lithographic apparatus, alignment apparatus, device manufacturing method, and a method of converting an apparatus
First Claim
1. A method of converting a projection lens system of a lithographic projection apparatus, the method comprising at least one of exchanging a compensating optical element in the optical path of the projection lens system for another compensating optical element, adding a further compensating optical element in the optical path of the projection lens system, and removing a further compensating optical element in the optical path of the projection lens system, such that with a liquid between the projection lens system and the point of focus of the projection lens system, the distance of the point of focus of the projection lens system from a non parallel optical element will remain the same as without the liquid between the projection lens system and the point of focus of the projection lens system.
1 Assignment
0 Petitions
Accused Products
Abstract
A detector detects liquid in the path of a projection beam or alignment beam. A controller then determines which one or more of a plurality of compensating optical elements may be provided in the optical path of the projection beam or alignment beam in order to focus the projection beam or alignment beam on the surface of the substrate. The appropriate optical element may be placed in the path of the projection beam or alignment beam directly as a final element of the projection system or alignment system respectively.
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Citations
89 Claims
- 1. A method of converting a projection lens system of a lithographic projection apparatus, the method comprising at least one of exchanging a compensating optical element in the optical path of the projection lens system for another compensating optical element, adding a further compensating optical element in the optical path of the projection lens system, and removing a further compensating optical element in the optical path of the projection lens system, such that with a liquid between the projection lens system and the point of focus of the projection lens system, the distance of the point of focus of the projection lens system from a non parallel optical element will remain the same as without the liquid between the projection lens system and the point of focus of the projection lens system.
- 13. A method of converting a projection lens system of a lithographic projection apparatus, the method comprising at least one of exchanging a compensating optical element in the optical path of the projection lens system for another compensating optical element, adding a further compensating optical element in the optical path of the projection lens system, and removing a further compensating optical element in the optical path of the projection lens system, such that without a liquid between the projection lens system and the point of focus of the projection lens system, the distance of the point of focus of the projection lens system from a non parallel optical element will remain the same as with the liquid between the projection lens system and the point of focus of the projection lens system.
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25. A method of converting a projection lens system of a lithographic projection apparatus, the method comprising at least one of exchanging a compensating optical element in the optical path of the projection lens system for another compensating optical element, adding a further compensating optical element in the optical path of the projection lens system, and removing a further compensating optical element in the optical path of the projection lens system such that the at least one of the presence and position of the compensating optical element in the optical path of the projection lens system is adjusted to ensure that the total optical path length between a patterning device and the point of focus of a patterned beam remains unchanged with a liquid between the projection lens system and a substrate from without the liquid between the projection lens system and the substrate.
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26. A method of converting a projection lens system of a lithographic projection apparatus, the method comprising at least one of exchanging a compensating optical element in the optical path of the projection lens system for another compensating optical element, adding a further compensating optical element in the optical path of the projection lens system, and removing a further compensating optical element in the optical path of the projection lens system such that the at least one of the presence and position of the compensating optical element in the optical path of the projection lens system is adjusted to ensure that the total optical path length between a patterning device and the point of focus of a patterned beam remains unchanged without liquid between the projection lens system and a substrate from with the liquid between the projection lens system and the substrate.
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27. A lithographic apparatus comprising:
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an illumination system configured to provide a beam of radiation;
a support structure configured to hold a patterning device, the patterning device configured to impart the beam with a pattern in its cross-section;
a substrate table configured to hold a substrate;
a projection lens system configured to project the beam as patterned onto a target portion of the substrate; and
a plurality of optical elements removably positionable in the path of the beam to adjust the focal plane of the beam, wherein the at least one of the presence and position of one or more of the plurality of optical elements in the path of the beam can be adjusted to ensure that the total optical path length of the beam remains unchanged irrespective of the presence or absence of liquid between the projection lens system and the substrate table. - View Dependent Claims (28, 29)
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30. A lithographic apparatus comprising:
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an illumination system configured to provide a beam of radiation;
a support structure configured to hold a patterning device, the patterning device configured to impart the beam with a pattern in its cross-section;
a substrate table configured to hold a substrate;
a projection lens system configured to project the beam as patterned onto a target portion of the substrate; and
a plurality of optical elements removably positionable in the path of the beam to adjust the focal plane of the beam, wherein the at least one of the presence and position of one or more of the plurality of optical elements in the path of the beam is adjusted such that with a liquid between the projection lens system and the point of focus of the projection lens system, the point of focus of the projection lens system remains unchanged from without a liquid between the projection lens system and the point of focus of the projection lens system. - View Dependent Claims (31, 32)
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33. A lithographic apparatus comprising:
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an illumination system configured to provide a beam of radiation;
a support structure configured to hold a patterning device, the patterning device configured to impart the beam with a pattern in its cross-section;
a substrate table configured to hold a substrate;
a projection lens system configured to project the beam as patterned onto a target portion of the substrate;
a plurality of optical elements removably positionable in the path of the beam to adjust the focal plane of the beam; and
a plurality of docking stations in the path of the beam configured to hold the plurality of optical elements. - View Dependent Claims (34, 35, 36, 37, 38)
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39. A device manufacturing method comprising:
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projecting a beam as patterned by a patterning device onto a target portion of a substrate; and
adjusting the focal plane of the beam by interposing one or more of a plurality of optical elements in the path of the beam, to ensure that the focal point of the beam focuses on the same point regardless of the presence or absence of liquid in the beam. - View Dependent Claims (40, 41)
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- 42. A method of converting an alignment lens system of an alignment apparatus, said method comprising at least one of exchanging a compensating optical element in the optical path of the alignment lens system for another compensating optical element, adding a further compensating optical element in the optical path of the alignment lens system, and removing a further compensating optical element in the optical path of the alignment lens system, such that with a liquid between the alignment lens system and the point of focus of the alignment lens system, the distance of the point of focus of the alignment lens system from a non parallel optical element will remain the same as without the liquid between the alignment lens system and the point of focus of the alignment lens system.
- 54. A method of converting an alignment lens system of an alignment apparatus, the method comprising at least one of exchanging a compensating optical element in the optical path of the alignment lens system for another compensating optical element, adding a further compensating optical element in the optical path of the alignment lens system, and removing a further compensating optical element in the optical path of the alignment lens system, such that without a liquid between the alignment lens system and the point of focus of the alignment lens system, the distance of the point of focus of the alignment lens system from a non parallel optical element will remain the same as with the liquid between the alignment lens system and the point of focus of the alignment lens system.
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66. A method of converting an alignment lens system of an alignment apparatus, the method comprising at least one of exchanging a compensating optical element in the optical path of the alignment lens system for another compensating optical element, adding a further compensating optical element in the optical path of the alignment lens system, and removing a further compensating optical element in the optical path of the alignment lens system such that the at least one of the presence and position of the compensating optical element in the optical path of the alignment lens system is adjusted to ensure that the total optical path length between a reference mark and the point of focus of an alignment beam remains unchanged with a liquid between the alignment lens system and a substrate from without the liquid between the alignment lens system and the substrate table.
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67. A method of converting an alignment lens system of an alignment apparatus, the method comprising at least one of exchanging a compensating optical element in the optical path of the alignment lens system for another compensating optical element, adding a further compensating optical element in the optical path of the alignment lens system, and removing a further compensating optical element in the optical path of the alignment lens system such that the at least one of the presence and position of the compensating optical element in the optical path of the alignment lens system is adjusted to ensure that the total optical path length between a reference mark and the point of focus of an alignment beam remains unchanged without liquid between the alignment lens system and a substrate from with the liquid between the alignment lens system and the substrate table.
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68. An alignment apparatus comprising:
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a substrate table configured to hold a substrate, the substrate having a substrate mark;
an alignment lens system configured to detect alignment between a reference mark and the substrate mark using an alignment beam of radiation; and
a plurality of optical elements removably positionable in the path of the alignment beam configured to adjust the focal plane of the alignment lens system when detecting alignment, wherein the at least one of the presence and position of one or more of the plurality of optical elements in the path of the alignment beam can be adjusted to ensure that the total optical path length of the alignment beam remains unchanged irrespective of the quantity of liquid between the alignment lens system and the substrate table. - View Dependent Claims (69, 70, 71, 72)
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73. An alignment apparatus comprising:
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a substrate table configured to hold a substrate, the substrate having a substrate mark;
an alignment lens system configured to detect alignment between a reference mark and the substrate mark using an alignment beam of radiation; and
a plurality of optical elements removably positionable in the path of the alignment beam configured to adjust the focal plane of the alignment lens system when detecting alignment, wherein the at least one of the presence and position of one or more of the plurality of optical elements in the path of the alignment beam is adjusted such that with a liquid between the alignment lens system and the point of focus of the alignment lens system, the point of focus of the alignment lens system remains unchanged from without a liquid between the alignment lens system and the point of focus of the alignment lens system. - View Dependent Claims (74, 75, 76, 77)
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78. An alignment apparatus comprising:
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a substrate table configured to hold a substrate, the substrate having a substrate mark;
an alignment lens system configured to detect alignment between a reference mark and the substrate mark using an alignment beam of radiation;
a plurality of optical elements removably positionable in the path of the alignment beam configured to adjust the focal plane of the alignment lens system when detecting alignment; and
a plurality of docking stations in the path of the alignment beam configured to hold the plurality of optical elements. - View Dependent Claims (79, 80, 81, 82, 83, 84, 85)
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86. An alignment apparatus comprising:
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a substrate table configured to hold a substrate, the substrate having a substrate mark;
an alignment lens system configured to detect alignment between a reference mark and the substrate mark using an alignment beam of radiation;
a plurality of optical elements removably positionable in the path of the alignment beam configured to adjust the focal plane of the alignment lens system when detecting alignment;
a detector configured to detect the presence of liquid between the alignment lens system and the substrate table; and
a controller configured to control which one or more of the plurality of optical elements is placed in the path of the alignment beam on the basis of results from the detector. - View Dependent Claims (87, 88, 89)
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Specification