Method of measuring noise figure using arbitrary waveforms

• US 20050137814A1
• Filed: 12/19/2003
• Published: 06/23/2005
• Est. Priority Date: 12/19/2003
• Status: Abandoned Application

• Current Assignee: Agilent Technologies, Inc.
• Original Assignee: Agilent Technologies, Inc.
• Inventors: Kelly, Joseph, Kara, Miklos T.
• Application Number:
  US10/741,895
• Publication Number:
  US 20050137814A1
• Time in Patent Office: Days
• US Class Current: 702/69
• CPC Class Codes: G01R 29/26 Measuring noise figure; Measuring signal-to-noise ratio

Abstract

Noise figure of a device under test (“DUT”) is measured using a programmable RF source and a receiver, such as a spectrum analyzer. The programmable RF source is operated to produce pseudonoise, such as white Gaussian noise (“WGN”), as the hot noise source. Turning the programmable RF source off provides a good termination to the DUT, which is used as a cold noise source. Alternatively, The pseudonoise produced by the programmable RF source is more predictable in amplitude and frequency hopping than true noise, resulting in faster calibration and measurement.

Claims

1. A method of measuring noise figure comprising:

placing a through line between a source and a receiver;

producing first noise power;

measuring a first measured noise power over a selected bandwidth with the receiver;

programming the source to produce an arbitrary waveform simulating hot noise power over the selected bandwidth;

measuring a second measured noise power over the selected bandwidth with the receiver;

placing a device under test (“

DUT”

) between the source and the receiver;

producing the first noise power;

measuring a third measured noise power with the receiver;

programming the source to produce the arbitrary waveform;

measuring a fourth measured noise power over the selected bandwidth with the receiver; and

calculating a noise figure of the DUT.

2. The method of claim 1 wherein the step of placing a through line comprises using RF switches to switch the DUT out of a signal path and the through line into the signal path.

3. The method of claim 1 wherein the arbitrary waveform comprises a bandwidth-limited white Gaussian noise waveform.

4. The method of claim 1 wherein the step of measuring the third measured noise power with the receiver comprises measuring the third measured noise power N times to obtain N third measured noise powers, where N is an integer greater than one, and averaging the N third measured noise powers to obtain an average third measured noise power used to calculate the noise figure of the DUT.

5. The method of claim 1 wherein the step of measuring the fourth measured noise power comprises measuring the fourth measured noise power M times to obtain M fourth measured noise powers, where M is an integer greater than one, and averaging the M fourth measured noise powers to obtain an average fourth measured noise power used to calculate the noise figure of the DUT.

6. The method of claim 1 wherein the step of measuring the fourth measured noise power comprises measuring the fourth measured noise power M times to obtain M fourth measured noise powers, where M is an integer greater than one, and averaging the M fourth measured noise powers to obtain an average fourth measured noise power, and wherein the step of measuring the third measured noise power with the receiver comprises measuring the third measured noise power N times to obtain N third measured noise powers, where N is an integer greater than M, and averaging the N third measured noise powers to obtain an average third measured noise power, and the noise figure of the DUT is calculated using the average fourth measured noise power and the average third measured noise power.

7. The method of claim 1 wherein the step of producing first noise power comprises turning off the source.

8. The method of claim 1 wherein the step of producing the first noise power comprises programming the source to produce a second arbitrary waveform simulating cold noise power over the selected bandwidth.

9. The method of claim 1 wherein the step of producing the first noise power comprises coupling a termination to the through line.

10. The method of claim 1 wherein the source is in an on state between the step of measuring the second measured noise power and the step of measuring the fourth measured noise power.

11. The method of claim 1 further comprising steps, prior to the step of measuring the third measured noise power, of

identifying a cold noise portion of the arbitrary waveform with the receiver;

and, prior to the step of measuring the fourth measured noise power, of

identifying a hot noise portion of the arbitrary waveform with the receiver.

12. The method of claim 1 wherein the receiver is a spectrum analyzer.

13. The method of claim 12 wherein the spectrum analyzer is synchronized to the source to measure a selected portion of the arbitrary waveform.

14. An electronic device measured according to the method of claim 1.

15. A method of measuring noise figure comprising:

placing a through line between a source and an amplifier coupled to a receiver;

producing first noise power;

amplifying the first noise power;

measuring a first measured noise power over a selected bandwidth with the receiver;

programming the source to produce an arbitrary waveform simulating hot noise power over the selected bandwidth;

amplifying the arbitrary waveform;

measuring a second measured noise power over the selected bandwidth with the receiver;

placing a device under test (“

DUT”

) between the source and the amplifier;

producing the first noise power;

measuring a third measured noise power over the selected bandwidth with the receiver;

programming the source to produce the arbitrary waveform simulating hot noise power over the selected bandwidth;

measuring a fourth measured noise power over the selected bandwidth with the receiver; and

calculating a noise figure of the DUT.