SYSTEM AND METHOD TO TEST INTEGRATED CIRCUITS ON A WAFER
First Claim
Patent Images
1. A system to test integrated circuits on a wafer, comprising:
- a transceiver formed on the wafer; and
an antenna system couplable to the transceiver.
1 Assignment
0 Petitions
Accused Products
Abstract
A system to test integrated circuits on a wafer may include a transceiver formed on the wafer. The system may also include an antenna system couplable to the transceiver. The transceiver may be formed in one of a scribe line on the wafer, a chip on the wafer or on an usable portion of the wafer. The antenna system may be formed in at least one of the same scribe line as the transceiver or in at least one other scribe line formed in the wafer. Alternatively, the antenna system may include an antenna external to the wafer.
-
Citations
70 Claims
-
1. A system to test integrated circuits on a wafer, comprising:
-
a transceiver formed on the wafer; and
an antenna system couplable to the transceiver. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26, 27, 28, 29)
-
-
30. A system to test integrated circuits on a wafer, comprising:
-
a plurality of transceivers each adapted to receive and transmit signals to test selected ones of a multiplicity of integrated circuits formed on the wafer and each of the transceivers being formed at a different location on the wafer in one of a plurality of scribe lines formed in the wafer or at other locations on the wafer; and
at least one antenna systems couplable to the plurality of transceivers. - View Dependent Claims (31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42)
-
-
43. A transceiver to test integrated circuits on a wafer, comprising:
-
a down converter to convert a received radio frequency (RF) signal to an intermediate frequency (IF) signal;
a received signal strength indicator (RSSI);
an amplifier to amplify the IF signal in response to the RSSI; and
a comparator to generate a data signal in response to the amplified IF signal. - View Dependent Claims (44, 45, 46)
-
-
47. An antenna system to test integrated circuits on a wafer, comprising:
-
a loop antenna adapted to be shared by a plurality of transceivers; and
a plurality of differential amplifier circuits, each differential amplifier circuit being associated with one of the plurality of transceivers, wherein only one of the plurality of differential amplifier circuits is active at any given time to permit the associated transceiver to receive or transmit signals. - View Dependent Claims (48, 49, 50, 51)
-
-
52. A method of making a system to test integrated circuits on a wafer, comprising:
-
forming a transceiver on the wafer; and
providing an antenna system couplable to the transceiver. - View Dependent Claims (53, 54, 55, 56, 57, 58, 59, 60)
-
-
61. A method to test integrated circuits on a wafer, comprising:
-
selecting at least one integrated circuit of a plurality of integrated circuits to be tested;
performing a test or self-test on the at least one selected integrated circuit in response to selecting the at least one integrated circuit; and
transmitting test results via a transceiver associated with the at least one selected integrated circuit. - View Dependent Claims (62, 63, 64, 65, 66, 67, 68, 69, 70)
-
Specification