Anodizing system with a coating thickness monitor and an anodized product

• US 20050139159A1
• Filed: 09/29/2004
• Published: 06/30/2005
• Est. Priority Date: 12/30/2003
• Status: Active Grant

• Current Assignee: Sensory Analytics, LLC
• Original Assignee: Analytical Technologies, LLC
• Inventors: Price, Joseph K.
• Granted Patent: US 7,274,463 B2
• Time in Patent Office: Days
• US Class Current: 118/712
• CPC Class Codes: C25D 11/02 Anodisation
• CPC Class Codes: C25D 21/12 Process control or regulation controlling or regulating in general G05

Abstract

An anodizing system for forming a anodized coating on at least a portion of a substrate thereby creating an anodized substrate is disclosed. The anodizing system includes a bath, a coating thickness monitor, at least one probe and at least one controller. The coating thickness monitor includes at least one radiation source directed at at least a portion of the anodized substrate; at least one probe for capturing at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed the anodized substrate from the radiation source; and at least one detector in communication with the at least one probe, the at least one detector capable of processing the captured radiation to allow a determination of at least the thickness.

Claims

1-6. -6. (canceled)

7. A coating thickness monitor for measuring the thickness of at least a portion of an anodized coating on at least a portion of a substrate formed in an anodizing system having a bath into which the substrate is placed to facilitate the formation of the anodized coating on the substrate thereby creating the anodized substrate, said coating thickness monitor including:

(a) at least one radiation source directed at at least a portion of the anodized substrate;

(b) at least one probe for capturing at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed the anodized substrate from said radiation source;

(c) at least one detector in communication with said at least one probe, said at least one detector capable of processing the captured radiation to allow a determination of at least the thickness of the anodized coating on the substrate; and

(d) a guide system capable of transmitting the captured radiation from said at least one probe to said at least one detector.

8. The coating thickness monitor according to claim 7 wherein said guide system is an optical guide.

9. The coating thickness monitor according to claim 8 wherein said optical guide is an optical fiber.

10. The coating thickness monitor according to claim 9 wherein said optical fiber is a plurality of optical fibers.

11. The coating thickness monitor according to claim 8 further including an additional guide system capable of transmitting at least a portion of the radiation from said at least one radiation source to direct the at least a portion of the radiation at at least a portion of the anodized substrate.

12. The coating thickness monitor according to claim 11 wherein said additional guide system is an additional optical guide.

13. The coating thickness monitor according to claim 12 wherein said additional optical guide is an optical fiber.

14. The coating thickness monitor according to claim 13 wherein said additional optical fiber is a plurality of optical fibers.

15. The coating thickness monitor according to claim 11 further including a supplementary guide system capable of at least one of:

(1) transmitting additional captured radiation from said at least one probe to said at least one detector;

(2) transmitting at least a portion of the radiation from at least one additional radiation source to direct at least a portion of the additional radiation at at least a portion of the anodized substrate; and

(3) transmitting at least a portion of the additional radiation from at least one additional radiation source to direct the at least a portion of the additional radiation at at least a portion of the anodized substrate and transmitting the additional captured radiation from said at least one probe to said at least one detector, the additional captured radiation being at least a portion of the additional radiation directed at the anodized substrate from said at least one additional radiation source.

16. The coating thickness monitor according to claim 14 wherein said supplementary guide is an additional optical guide.

17. The coating thickness monitor according to claim 16 wherein the said optical guide is an optical fiber.

18. The coating thickness monitor according to claim 16 wherein the said optical fiber is a plurality of optical fibers.

19. The coating thickness monitor according to claim 15 wherein said guide system and said supplementary guide system are selected to be capable of transmitting a broad spectral range of captured radiation from said at least one probe to said at least one detector.

20. The coating thickness monitor according to claim 7 wherein said at least one radiation source is polychromatic.

21. The coating thickness monitor according to claim 20 wherein the polychromatic radiation includes at least one of ultraviolet radiation, visible radiation, and infrared radiation.

22. The coating thickness monitor according to claim 7 wherein said at least one source radiation is monochromatic.

23. The coating thickness monitor according to claim 7 further including an additional radiation source.

24. The coating thickness monitor according to claim 23 wherein said additional radiation is polychromatic.

25. The coating thickness monitor according to claim 23 wherein said additional polychromatic radiation is at least one of ultraviolet radiation, visible radiation, and infrared radiation.

26. The coating thickness monitor according to claim 23 wherein said additional radiation is monochromatic.

27. The coating thickness monitor according to claim 23 wherein a spectral range of said at least one radiation source and a spectral range of said additional radiation source partially overlap.

28. The coating thickness monitor according to claim 27 wherein said partial overlap increases at least one of a signal to noise ratio for the captured radiation and a total spectral range of captures radiation.

29. The coating thickness monitor according to claim 23 wherein one of said at least one radiation source and said additional radiation source is visible radiation and the other of said at least radiation source and said additional radiation source is infrared radiation.

30. The coating thickness monitor according to claim 7 said at least one probe further includes a collimator.

31. The coating thickness monitor according to claim 30 wherein said collimator facilities a depth of field of a sufficient value to measure the anodized coating thickness.

32. The coating thickness monitor according to claim 7 wherein said at least one probe is external to said bath.

33. The coating thickness monitor according to claim 7 wherein the at least one probe is within said bath.

34. The coating thickness monitor according to claim 7 wherein said at least one detector includes an interferometer.

35. The coating thickness monitor according to claim 7 wherein said processing of the captured radiation to determine the coating thickness by said coating thickness monitor includes at least one of using a color, using an interference pattern, using an amount of absorbed radiation, using an intensities ratio of a minimum reflected radiation wavelength and a maximum reflected radiation wavelength, and using a Fast Fourier Transformation (FFT) of the captured radiation.

36. The coating thickness monitor according to claim 7 wherein said processing of the captured radiation to determine the coating thickness by said coating thickness monitor includes using a Fast Fourier Transformation (FFT) of the captured radiation.

37-77. -77. (canceled)