Multi-axis interferometers and methods and systems using multi-axis interferometers
First Claim
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1. An apparatus, comprising:
- a multi-axis interferometer configured to produce at least three output beams each including interferometric information about a distance between the interferometer and a measurement object along a corresponding measurement axis, wherein at least three of the measurement axes are in a common plane, wherein the output beams each include a component that makes a pass to the measurement object along a common beam path.
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Abstract
In general, in one aspect, the invention features an apparatus including a multi-axis interferometer configured to produce at least three output beams each including interferometric information about a distance between the interferometer and a measurement object along a corresponding measurement axis, wherein at least three of the measurement axes are in a common plane, wherein the output beams each include a component that makes a pass to the measurement object along a common beam path.
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Citations
39 Claims
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1. An apparatus, comprising:
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a multi-axis interferometer configured to produce at least three output beams each including interferometric information about a distance between the interferometer and a measurement object along a corresponding measurement axis, wherein at least three of the measurement axes are in a common plane, wherein the output beams each include a component that makes a pass to the measurement object along a common beam path. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
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20. Apparatus comprising:
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a multi-axis interferometer configured to produce at least three output beams each including interferometric information about a distance between the interferometer and a measurement object along a corresponding measurement axis; and
an electronic processing system coupled to the multi-axis interferometer, wherein the electronic processing system is configured to calculate a value for a second difference parameter (SDP) for the measurement object based on the distances between the interferometer and the measurement object along the at least three measurement axes. - View Dependent Claims (21, 22, 23, 24, 25, 26, 27, 28)
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29. An apparatus, comprising:
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a multi-axis interferometer configured to produce at least three output beams each including interferometric information about a distance between the interferometer and a measurement object along a corresponding measurement axis, wherein the output beams each include a component that makes one pass to the measurement object along a common measurement beam path; and
an electronic processor configured to derive information about the surface figure profile of the measurement object from the output beams as the measurement object is scanned relative to the interferometry system along a distance non-parallel to the measurement axes. - View Dependent Claims (30, 31, 32, 33, 34, 35)
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36. An apparatus, comprising:
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a multi-axis interferometer configured to produce at least three output beams each including interferometric information about a distance between the interferometer and a measurement object along a corresponding measurement axis; and
an electronic processing system coupled to the multi-axis interferometer, wherein the electronic processing system is configured to calculate a value for an expression related to a second spatial derivative of a surface figure profile of the measurement object based on the distances between the interferometer and the measurement object along the at least three measurement axes. - View Dependent Claims (37)
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38. A method, comprising:
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producing at least three output beams each including interferometric information about a distance between the interferometer and a measurement object along a corresponding measurement axis; and
calculating a value for a second difference parameter (SDP) for the measurement object based on the distances between the interferometer and the measurement object along the at least three measurement axes.
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39. A method, comprising:
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producing at least three output beams each including interferometric information about a distance between the interferometer and a measurement object along a corresponding measurement axis, wherein the output beams each include a component that makes one pass to the measurement object along a common measurement beam path; and
deriving information about the surface figure profile of the measurement object from the output beams as the measurement object is scanned relative to the interferometry system along a distance non-parallel to the measurement axes.
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Specification