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Circuits for transistor testing

  • US 20050156605A1
  • Filed: 12/23/2004
  • Published: 07/21/2005
  • Est. Priority Date: 12/24/2003
  • Status: Active Grant
First Claim
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1. A circuit for transistor testing, comprising:

  • a plurality of contact pads connectable to a plurality of terminals of a plurality of transistors;

    a plurality of first resistors connected to a plurality of gates of a plurality of the transistors, respectively by voltage distribution according to a resistance ratio, respectively; and

    a plurality of second resistors connected between a plurality of gate electrodes and drains of a plurality of the transistors, respectively wherein a plurality of voltages applied to a plurality of the gates of a plurality of the transistors are dropped by a plurality of the second resistors to be applied to a plurality of drains of a plurality of the transistors, respectively.

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