Voltage testing and measurement
4 Assignments
0 Petitions
Accused Products
Abstract
An improved voltage test system.
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Citations
8 Claims
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1. (canceled)
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2. A method of testing a device under test comprising:
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(a) providing a coherent beam of light from a light source having a first wavelength;
(b) imposing said coherent beam of light on a test device over a spatial region within said test device greater than said first wavelength, wherein said test device has a first state;
(c) imposing said beam of light on said test device over a spatial region within said test device greater than said first wavelength, wherein said test device has a second state;
(d) obtaining data resulting from the interference of said first beam and said second beam within said device under test representative of the voltages within said region;
(e) wherein said first state is at a first voltage potential, and wherein said second state is at a second voltage potential different from said first voltage potential. - View Dependent Claims (3, 4, 5, 6, 7, 8)
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Specification