Methods and apparatuses for reducing infant mortality in semiconductor devices utilizing static random access memory (SRAM)
First Claim
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1. A method comprising:
- detecting a first location-independent error within an area of a cache memory;
determining whether the first error is a second consecutive error associated with the area; and
preventing further use of the area if the error is determined to be the second consecutive error associated with the area.
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Abstract
In accordance with various embodiments of the present invention, a cache-equipped semi-conductor device is provided with enhanced error detection logic to detect a first location-independent error within an area of the cache memory and prevent further use of the area if the error is determined to be the second consecutive error associated with a common area.
36 Citations
30 Claims
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1. A method comprising:
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detecting a first location-independent error within an area of a cache memory;
determining whether the first error is a second consecutive error associated with the area; and
preventing further use of the area if the error is determined to be the second consecutive error associated with the area. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. A method comprising:
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detecting a first error within a cache line of a cache memory;
disabling the cache line of the cache memory; and
dynamically modifying a cache management system to at least inhibit subsequent access to the disabled cache line by a processor. - View Dependent Claims (13, 14, 15)
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16. A processor comprising:
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a cache memory;
error detection logic coupled to the cache memory, the error detection logic equipped to detect a first location-independent error within an area of the cache memory, determine whether the first error is a second consecutive error associated with the area; and
prevent further use of the area if the error is determined to be the second consecutive error associated with the area. - View Dependent Claims (17, 18, 19, 20)
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21. A processor comprising:
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a cache memory and error detection logic coupled to the cache memory, the error detection logic equipped to detect a first error within a cache line of a cache memory;
disable the cache line of the cache memory; and
dynamically modify a cache management system to at least inhibit subsequent access to the disabled cache line by a processor. - View Dependent Claims (22, 23, 24)
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25. A system comprising:
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a dynamic random access memory; and
an integrated circuit coupled to the dynamic random access memory, the integrated circuit including a cache memory and error detection logic, wherein the error detection logic is equipped to detect a first location-independent error within an area of the cache memory, determine whether the first error is a second consecutive error associated with the area, and prevent further use of the area if the error is determined to be the second consecutive error associated with the area. - View Dependent Claims (26, 27)
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28. A system comprising:
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a dynamic random access memory; and
an integrated circuit coupled to the dynamic random access memory, the integrated circuit including a cache memory and error detection logic, wherein the error detection logic is equipped to detect a first error within a cache line of the cache memory;
disable the cache line of the cache memory; and
dynamically modify a cache management system to at least inhibit subsequent access to the disabled cache line by a processor. - View Dependent Claims (29, 30)
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Specification