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Methods and apparatuses for reducing infant mortality in semiconductor devices utilizing static random access memory (SRAM)

  • US 20050160326A1
  • Filed: 12/31/2003
  • Published: 07/21/2005
  • Est. Priority Date: 12/31/2003
  • Status: Active Grant
First Claim
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1. A method comprising:

  • detecting a first location-independent error within an area of a cache memory;

    determining whether the first error is a second consecutive error associated with the area; and

    preventing further use of the area if the error is determined to be the second consecutive error associated with the area.

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