Contact sensitive device
First Claim
Patent Images
1. A contact sensitive device comprising:
- a member capable of supporting bending waves;
a plurality of sensors for measuring bending wave vibration in the member, wherein each of the sensors determines a measured bending wave signal; and
a processor responsive to the measured bending wave signals to calculate a location of a contact on the member, the processor calculating a phase angle for each measured bending wave signal and a phase difference between the phase angles of at least two pairs of sensors so that at least two phase differences are calculated and utilized in determining the location of the contact, wherein the phase difference between the phase angles of each pair of sensors is given by
Δ
θ
lm=θ
l−
θ
m=k(ω
0)Δ
xlm+π
nlm
where θ
i is the phase angle of a measured bending wave signal, xi is the distance from the contact location to each sensor, Δ
xlm=xl−
xm is a path length difference of two sensors, k(ω
) is a wavevector and nlm is an integer.
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Abstract
A contact sensitive device includes a member capable of supporting bending waves and a plurality of sensors mounted on the member for measuring bending wave vibration in the member. The sensors measure the bending wave signals and by calculating a phase angle for each measured bending wave signal and a phase difference between the phase angles of least two pairs of sensors so that at least two phase differences are calculated, the location of the contact can be determined.
54 Citations
20 Claims
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1. A contact sensitive device comprising:
-
a member capable of supporting bending waves;
a plurality of sensors for measuring bending wave vibration in the member, wherein each of the sensors determines a measured bending wave signal; and
a processor responsive to the measured bending wave signals to calculate a location of a contact on the member, the processor calculating a phase angle for each measured bending wave signal and a phase difference between the phase angles of at least two pairs of sensors so that at least two phase differences are calculated and utilized in determining the location of the contact, wherein the phase difference between the phase angles of each pair of sensors is given by
Δ
θ
lm=θ
l−
θ
m=k(ω
0)Δ
xlm+π
nlm
where θ
i is the phase angle of a measured bending wave signal, xi is the distance from the contact location to each sensor, Δ
xlm=xl−
xm is a path length difference of two sensors, k(ω
) is a wavevector and nlm is an integer. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A method of determining information relating to a contact on a contact sensitive device comprising:
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providing a member capable of supporting bending waves and a plurality of sensors for measuring bending wave vibration in the member;
measuring a bending wave signal using each of the sensors in response to a contact being applied to the member at a location;
determining a phase angle for each measured bending wave signal;
calculating a phase difference between the phase angles of at least two pairs of sensors; and
determining the location of the contact utilizing the at least two calculated phase differences. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16, 17)
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18. A method for determining a location of a contact on a member capable of supporting bending waves, the member having a plurality of sensors for measuring bending wave vibration in the member, the method comprising:
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measuring bending wave signals at each of the sensors in response to the contact being applied to the member at the location;
determining the location of the contact using at least one path length difference for each sensor pair of at least two sensor pairs, the at least one path length difference of each sensor pair being determined according to a phase angle difference the bending wave signals measured by each sensor of the sensor pair. - View Dependent Claims (19, 20)
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Specification