×

ECMP system

  • US 20050167266A1
  • Filed: 02/02/2004
  • Published: 08/04/2005
  • Est. Priority Date: 02/02/2004
  • Status: Abandoned Application
First Claim
Patent Images

1. A method of IR correction for use in an ECMP cell having, within an electrolyte, at least a working electrode, a counter electrode, and a reference electrode adjacent to the working electrode, the method comprising:

  • measuring a voltage transient between the reference electrode and the working electrode resulting from application of a substantially square step function test signal to the ECMP cell;

    deriving from the voltage transient a measure of the resistive impedance of the ECMP circuit between and including the working electrode and the reference electrode; and

    subsequently using the measure of resistive impedance to derive an IR correction to the measured voltage between the working electrode and the reference electrode.

View all claims
  • 2 Assignments
Timeline View
Assignment View
    ×
    ×