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Diagnostic method for detection of multiple defects in a Level Sensitive Scan Design (LSSD)

  • US 20050172188A1
  • Filed: 01/29/2004
  • Published: 08/04/2005
  • Est. Priority Date: 01/29/2004
  • Status: Active Grant
First Claim
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1. A method of identifying one or more defective shift register latches in a scan chain, the method comprising:

  • electrically coupling a plurality of shift register latches into a series configuration so as to form a scan chain circuit, wherein each of the shift register latches includes a first latch and a second latch connected in a master-slave configuration, wherein each of the first latch and second latch includes at least one clock input;

    placing the scan chain circuit into an operating region;

    loading a scan test pattern into the scan chain circuit;

    placing the scan chain circuit into a failing region;

    applying a shift clock pulse to the clock input of the second latch;

    placing the scan chain circuit into an operating region; and

    unloading the scan chain.

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