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Method and apparatus for measuring forward voltage drop of light emitting element, light source apparatus, and thermal printer

  • US 20050174420A1
  • Filed: 02/02/2005
  • Published: 08/11/2005
  • Est. Priority Date: 02/10/2004
  • Status: Abandoned Application
First Claim
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1. A forward voltage drop measuring method of measuring forward voltage drop in a semiconductor array that consists of a plural number of columns of semiconductors which are connected in serial to each other in each column, wherein said columns are connected in parallel to each other, said method comprising steps of:

  • charging a capacitor that is connected in parallel to said columns of said semiconductors;

    discharging said capacitor through a selected one of said columns;

    measuring a voltage across said capacitor at a time during the discharge of said capacitor or at a time of completion of the discharge; and

    detecting a forward voltage drop across said selected column based on said measured voltage.

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