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Defect identification signal analysis method

  • US 20050177352A1
  • Filed: 02/05/2004
  • Published: 08/11/2005
  • Est. Priority Date: 02/05/2004
  • Status: Abandoned Application
First Claim
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1. A method of characterizing defects in a part, the method comprising:

  • a) identifying a numerically quantifiable physical property that provides good part array Ai of n numerical values given by equation 1 that characterize a first reference part without a defect and defect array Bi of n values as provided by equation 2 that characterize a second reference part with a known defect;


    Aiε

    (A1, A2, . . . An)  



    1;


    Biε

    (B1, B2, . . . Bn)  



    2;

    wherein, n is an integer, and array Ai and array Bi are ordered by an independent parameter pi that is associated with the values in array Ai and array Bi through the functional relationship Ai=fa(pi) and Bi=fb(pi);

    b) creating good part vector A of n dimensions as provided by equation 3 whose components are the n numerical values in good part array Ai;


    A=<

    A1, A2, . . . An>





    3;

    c) creating defect vector B of n dimensions as provided by equation 4 whose components are the n values in defect array Bi;


    B=<

    B1, B2, . . . Bn>





    4;

    d) identifying vector R by selecting a vector from the group consisting of vector B, vector C, vector D, and vector E;

    wherein, vector C is created by taking the difference between good part vector A and defect vector B as provided in equation 5;


    C=A−

    B




    5; and

    vector D is formed by;

    1) creating difference vector C of n dimensions as provided by equation 5 which is the difference between good part vector A and defect vector B;


    C=A−

    B




    5;

    2) identifying m components of vector C as provided by equation 6 having the largest magnitudes;


    C′

    iε

    (C′

    1, C′

    2, . . . C′

    m)  



    6;

    3) creating vector D of m dimensions as provided by equation 7 whose components are the n values in array C′

    i D=

    C1

    ,C2

    ,







    Cm









    =

    D1,D2,







    Dm


    ;

    7
    and vector E is formed by;

    1) creating difference vector C of n dimensions as provided by equation 5 which is the difference between good part vector A and defect vector B;


    C=A−

    B




    5;

    2) identifying m components of vector C as provided by equation 6 having the largest magnitudes;


    C′

    iε

    (C′

    1, C′

    2, . . . C′

    m)  



    6;

    3) creating vector D of m dimensions as provided by equation 7 whose components are the n values in array D=

    C1

    ,C2

    ,







    Cm









    =

    D1,D2,







    Dm


    ;

    7
    7; and

    5) normalizing vector D to form vector E as provided in equation 9;


    E=D/|D|



    8;

    e) determining array Fi of n numerical values as provided by equation 9 that characterize a test part that may have an unknown defect using the numerically quantifiable physical property;


    Fiε

    (F1, F2, . . . Fn)  



    9;

    f) creating vector F of n dimensions as provided by equation 10 whose components are the n values in array Fi;


    F<

    F1, F2, . . . Fn>





    10;

    9) identifying vector S by selecting a vector selected from the group consisting of vector F, vector G, vector H, and vector I, wherein, vector G is formed by taking the difference between vector A and vector F as provided in equation 11;


    G=A−

    F




    11; and

    vector H is formed by;

    1) creating vector G as provided by equation 11 which is the difference between vector A and vector F;


    G=A−

    F




    11;

    2) identifying m components of vector G as provided by equation 12 which correspond to the same values for pi as the m components selected in step d for vector F;


    G′

    iε

    (G′

    1, G′

    2, . . . G′

    m)  



    12;

    3) creating vector H as provided in equation 13 of dimension m having as components only the m components of step 2;

    H=

    G1

    ,G2

    ,







    Gm



    =

    H1,H2,







    Hm








    13
    ;

    4) normalizing vector H to create vector I as provided in equation 14;


    I=H/|H|



    14; and

    vector I is formed by;

    1) creating vector G as provided by equation 11 which is the difference between-vector A and vector F;


    G=A−

    F




    11;

    2) identifying m components of vector G as provided by equation 12 which correspond to the same values for pi as the m components selected in step d for vector F;


    G′

    iε

    (G′

    1, G′

    2, . . . G′

    m)  



    12;

    3) creating vector H as provided in equation 13 of dimension m having as components only the m components of step 2;

    H=

    G1

    ,G2

    ,







    Gm



    =

    H1,H2,







    Hm








    13
    ;

    4) normalizing vector H to create vector I as provided in equation 14;


    I=H/|H|



    14; and

    h) forming dot product DP as provided in equation 15;


    DP=R·

    S




    15;

    wherein the dot product provides a number related to the probability that the test part that may have an unknown defect has the known defect in the second reference part with the proviso that when vector B is selected in step d vector F is selected in step g, vector C is selected in step d vector G is selected in step g, vector D is selected in step d vector H is selected in step g, and vector E is selected in step d vector I is selected in step g.

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