Testing of wire systems and end devices installed in industrial processes

• US 20050182581A1
• Filed: 04/07/2005
• Published: 08/18/2005
• Est. Priority Date: 05/14/2002
• Status: Active Grant

• Current Assignee: Analysis And Measurement Services Corporation
• Original Assignee: Analysis And Measurement Services Corporation
• Inventors: Hashemian, Hashem M.
• Granted Patent: US 7,254,520 B2
• Time in Patent Office: Days
• US Class Current: 702/105
• CPC Class Codes: G05B 23/0283 Predictive maintenance, e.g. involving the monitoring of a system and, based on the monitoring results, taking decisions on the maintenance schedule of the monitored system; Estimating remaining useful life [RUL] preventive maintenance, i.e. planning maintenance according to the available resources without monitoring the system G06Q10/06

Abstract

A system and method for verifying the performance and health of wire systems and end devices, including instruments and processes. A computer runs software that collects data from sampled sensors, stores the data, screens the data for outliers, analyzes the data, performs in situ testing, and generates results of the analysis and testing. The system and method verifies not only the steady state performance of instruments, but also the dynamic performance of instruments and the transient behavior of the processes. In one embodiment, the system performs testing of the wiring system connecting the end devices located at the process. In another embodiment, the system also performs analysis of the amplitude probability density and a power spectral density determined from the sensor, or end device, data. In still another embodiment, the system performs a time domain reflectometry (TDR) analysis for a wiring system connecting an end device.

Claims

1. An integrated system for ensuring the performance and health of a plurality of wire systems, end devices, and processes, said system comprising:

a plurality of signals each representing an output from one of a plurality of end devices;

an output device, said output device adapted to send a test signal to a selected one of said end devices; and

a computer responsive to said plurality of signals, said computer communicating with said output device, said computer programmed to execute a process for verifying wiring system, end device, and process health comprising;

storing a plurality of sampled data in a storage media, said plurality of sampled data corresponding to said plurality of signals;

analyzing said sampled data and producing analysis results, said step of analyzing including performing a static analysis and performing a dynamic response analysis, and said step of analyzing further including performing an analysis of at least one of an amplitude probability density, a power spectral density, and a time domain reflectometry; and

determining a condition of said at least one of said plurality of end devices.

2. The integrated system of claim 1 wherein said test signal is initiated as part of said analysis of said time domain reflectometry, and said sampled data includes a reflection signal for said time domain reflectometry.

3. The integrated system of claim 1 wherein said process further includes determining whether a corrective action is required by said analysis results.

4. The integrated system of claim 1 wherein said process further includes determining whether a corrective action is required by said analysis results, and if corrective action is required, initiating said corrective action by communicating with said output device.

5. The integrated system of claim 1 wherein said condition includes at least one of a defective sensor, a skewed data distribution, and a cable condition.

6. The integrated system of claim 1 wherein said step of analyzing includes determining, from said amplitude probability density, at least one of a skewness value and a kurtosis value.

7. The integrated system of claim 1 wherein said process further includes screening said plurality of sampled data to remove outliers.

8. The integrated system of claim 1 wherein said process further includes calibrating said one of said end devices based on said sampled data if said one of said end devices is able to be calibrated.

9. At least one computer programmed to execute a process for verifying the performance and health of a plurality of wire systems, end devices, and processes, the process comprising:

storing a plurality of sampled data in storage media, said sampled data corresponding to a plurality of signals each representing an output from one of a plurality of end devices;

analyzing said sampled data and producing analysis results, said step of analyzing including performing a dynamic analysis and an analysis for wiring condition; and

determining whether a corrective action is required by said analysis results.

10. The process of claim 9 wherein said step of analyzing further includes performing a static analysis.

11. The process of claim 9 wherein said step of analyzing includes performing at least one analysis selected from a group including an analysis of an amplitude probability density, an analysis of a power spectral density, and an analysis of a time domain reflectometry.

12. The process of claim 9 wherein said corrective action includes at least one of an instrument calibration and an in situ test, and further including the step of initiating said corrective action if determined to be required.

13. The process of claim 9 wherein said step of analyzing includes determining, from said amplitude probability density, at least one of a skewness value and a kurtosis value.

14. The process of claim 9 further including a step of initiating an output of a test signal as part of said analysis of said time domain reflectometry, and said sampled data including a reflection signal for said time domain reflectometry.

15. The process of claim 9 further including a step of screening said sampled data to remove outliers.

16. A method for verifying the performance and health of a plurality of instruments and processes, said method comprising:

sampling data from a plurality of sensors, said sampled data corresponding to a plurality of signals each representing an output from one of a plurality of end devices as measured at the end of a cable;

storing said sampled data;

analyzing said sampled data, said step of analyzing including performing at least one analysis selected from a group including an analysis of an amplitude probability density, an analysis of a power spectral density, and an analysis of a time domain reflectometry; and

determining whether a corrective action is required by said analysis results; and

initiating said corrective action if determined to be required.

17. The method of claim 16 wherein said step of analyzing includes performing at least one of a static analysis and a dynamic analysis.

18. The method of claim 16 wherein said step of analyzing includes performing a static analysis and a dynamic analysis.

19. The method of claim 16 further including a step of screening said sampled data after said step of sampling data.

20. The method of claim 16 wherein said corrective action includes at least one of an instrument calibration and an in situ test.