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Pin-type probes for contacting electronic circuits and methods for making such probes

  • US 20050184748A1
  • Filed: 01/03/2005
  • Published: 08/25/2005
  • Est. Priority Date: 02/04/2003
  • Status: Abandoned Application
First Claim
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1. A pin probe for making electrical contact to an electronic circuit element, comprising:

  • (A) a pin element, comprising;

    (1) a first contact tip portion;

    (2) a second contact tip portion; and

    (3) a compliant portion having a first end and a second end, wherein the first end is functionally connected to the first tip portion and the second end is functionally connected to the second tip portion, and wherein the compliant portion comprises at least one element that comprises a plurality of turns.

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