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Systems and methods for inspecting coatings, surfaces and interfaces

  • US 20050186327A1
  • Filed: 11/12/2004
  • Published: 08/25/2005
  • Est. Priority Date: 07/29/2003
  • Status: Active Grant
First Claim
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1. A system for detecting defects in coatings comprising:

  • a) a temperature manipulation apparatus configured to change the temperature of a surface of a manufacturing part;

    b) an infrared sensor configured to measure the temperature of said surface over time, wherein said infrared sensor is configured to provide a first temperature profile of said surface at a first time and second temperature profile of said surface at a second time, each of said profiles containing a plurality of temperature data for a plurality of individual localized areas of said surface; and

    c) a processor configured to receive the first and second temperature profiles, to compare each of said profiles to a signature temperature profile, and to calculate a parameter representing the change in temperature over time for each localized area of each profile by comparing the temperature of each localized area with the temperatures of surrounding localized areas, wherein said processor is further configured to identify subsurface imperfections in said surface by comparing each of said temperature change parameters for each localized area to threshold levels.

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