Method for sorting integrated circuit devices
First Claim
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1. An integrated circuit process for determining at least one integrated circuit device in need of enhanced reliability testing from a group of integrated circuit devices undergoing test procedures, the integrated circuit devices each having a substantially unique identification code, the method comprising:
- storing an enhanced reliability testing flag for the identification code of each integrated circuit device of the integrated circuit devices in the group indicating whether each integrated circuit device requires the enhanced reliability testing;
automatically reading the identification code of each integrated circuit device of the integrated circuit devices in the group;
accessing the enhanced reliability testing flag stored for each of the automatically read identification codes of each integrated circuit device of the integrated circuit devices in the at least one group having the identification code thereof read; and
sorting the integrated circuit devices using the enhanced reliability testing flag indicating integrated circuit devices in need of the enhanced reliability testing for performing testing of integrated circuit devices only in need of the enhanced reliability testing.
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Abstract
A method for sorting integrated circuit (IC) devices of the type having a substantially unique identification (ID) code, such as a fuse ID, including automatically reading the ID code of each of the IC devices and sorting the IC devices in accordance with their automatically read ID codes, is disclosed.
101 Citations
3 Claims
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1. An integrated circuit process for determining at least one integrated circuit device in need of enhanced reliability testing from a group of integrated circuit devices undergoing test procedures, the integrated circuit devices each having a substantially unique identification code, the method comprising:
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storing an enhanced reliability testing flag for the identification code of each integrated circuit device of the integrated circuit devices in the group indicating whether each integrated circuit device requires the enhanced reliability testing;
automatically reading the identification code of each integrated circuit device of the integrated circuit devices in the group;
accessing the enhanced reliability testing flag stored for each of the automatically read identification codes of each integrated circuit device of the integrated circuit devices in the at least one group having the identification code thereof read; and
sorting the integrated circuit devices using the enhanced reliability testing flag indicating integrated circuit devices in need of the enhanced reliability testing for performing testing of integrated circuit devices only in need of the enhanced reliability testing.
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2. A method in a manufacturing process for determining at least one integrated circuit device in need of enhanced reliability testing from at least one group of individual integrated circuit devices undergoing test procedures, each individual integrated circuit devices each having a substantially unique identification code, the method comprising:
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storing an enhanced reliability testing flag in connection with the identification code of each integrated circuit device of the integrated circuit devices in the at least one group indicating whether each integrated circuit device requires the enhanced reliability testing;
automatically reading the identification code of each integrated circuit device of the integrated circuit devices in the at least one group;
accessing the enhanced reliability testing flag stored in connection with each of the automatically read identification codes of each integrated circuit device of the integrated circuit devices in the at least one group having the identification code thereof read;
sorting the integrated circuit devices in accordance with the enhanced reliability testing flag indicating the integrated circuit devices are in need of the enhanced reliability testing; and
performing testing of integrated circuit devices only in need of the enhanced reliability testing.
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3. A method in a manufacturing process for separating integrated circuit devices on one or more semiconductor wafers from a group of semiconductor wafers, each wafer having integrated circuit devices, the group of semiconductor wafers undergoing test procedures, to determine a need of any additional enhanced reliability testing, the integrated circuit devices each having a substantially unique identification code, the method comprising:
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storing an enhanced reliability testing indicator in connection with the identification code of each integrated circuit device of the integrated circuit devices in at least one group indicating whether each integrated circuit device requires the enhanced reliability testing;
automatically reading the identification code of each integrated circuit device of the integrated circuit devices in the at least one group;
accessing the enhanced reliability indicator stored in connection with each of the automatically read identification codes of each integrated circuit device of the integrated circuit devices in the at least one group having the identification code thereof read;
sorting the integrated circuit devices in accordance with whether their enhanced reliability testing indicator indicates the integrated circuit devices come from a semiconductor wafer which is known as an unreliable semiconductor wafer; and
performing testing only of integrated circuit devices in need of the enhanced reliability testing.
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Specification