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Interferometric sensor for characterizing materials

  • US 20050190372A1
  • Filed: 08/16/2004
  • Published: 09/01/2005
  • Est. Priority Date: 08/14/2003
  • Status: Active Grant
First Claim
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1. An interferometer based sensor comprising:

  • a low coherence light source and a light splitter positioned to direct light from said source to a sample and to a reference arm;

    light from said source backscattered by said sample;

    a reference arm capable of being set to a select optical path length;

    a first sample light collector positioned to collect a first backscattered light from said source interacting with said sample, a first detector generating a first signal in response to interference between the first backscattered light and light from said reference arm at said optical path length coupled together by a first light combiner;

    a second sample light collector, said second sample light collector separated from said first sample light collector, said second sample light collector positioned to collect backscattered light from said source interacting with said sample and a second detector generating a second signal, said second signal resulting from interference between said backscattered light and light from said reference arm at said optical path length coupled together by a second light combiner; and

    a processor that determines the absorption and scattering of the sample from said first signal and said second signal.

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