Manufacturing system, measurement data collecting system, and measurement terminal apparatus

• US 20050192695A1
• Filed: 04/25/2005
• Published: 09/01/2005
• Est. Priority Date: 03/18/2002
• Status: Active Grant

• Current Assignee: Atsushi Hirai, Hideo Torii, Koichi Kojima, Yoshifumi Yoshida, Yuya Ichikawa
• Original Assignee: Atsushi Hirai, Hideo Torii, Koichi Kojima, Yoshifumi Yoshida, Yuya Ichikawa
• Inventors: Yoshida, Yoshifumi, Kojima, Koichi, Hirai, Atsushi, Torii, Hideo, Ichikawa, Yuya
• Granted Patent: US 7,107,114 B2
• Time in Patent Office: Days
• US Class Current: 700/108
• CPC Class Codes: G06Q 10/00 Administration; Management

Abstract

A manufacturing system has an inspection data collecting apparatus that is capable of carrying out, upon receipt of a signal containing measurement data in different formats according to the type of inspection or a measuring instrument, processing in accordance with the signal and the format of data to create data in a certain format, and of transmitting a signal for giving an instruction to the measuring instrument in association with the format compatible with the measuring instrument. All data obtained by the inspections in all steps for manufacturing a product is accumulate as inspection data and exchanged among the steps.

Claims

1. A measurement data collecting system comprising:

at least a single processor connected by a communication line, each processor having at least a single unit, each unit being constructed of a means for implementing each of the functions that aid measurement.

2. The measurement data collecting system according to claim 1, wherein the functions that aid measurement further comprise:

a function for turning an instruction for carrying out measurement into data and processing the data;

a function for carrying out management based on the instruction and turning a measurement result obtained by the measurement into data and processing the data;

a function for displaying the status of the measurement on display, based on the measurement result;

a function for displaying the measurement result on a display;

a function for outputting the measurement result; and

a function for registering a measuring instrument used for the measurement.

3. The measurement data collecting system according to claim 1, further comprising:

an accumulating apparatus that exchanges data used for aiding measurement and data regarding measurement results obtained by the measurement with the processor, the accumulating apparatus being connected by the communication line.

4. The measurement data collecting system according to claim 2, wherein

the processor has a unit for implementing a function for turning a measurement result obtained by measurement into data and processing the data, and each processor further comprises:

interfacing means for converting a signal sent by one of a measuring instrument and the unit into a signal that can be processed by the other of the measuring instrument and the unit.

5. The measurement data collecting system according to claim 2, wherein

the unit is constructed for implementing a function for turning a measurement result obtained by measurement into data and processing the data, and further comprises:

a measuring instrument interface that processes a signal including a measurement result as data according to at least one of the type of measurement and a measuring instrument into data of a certain format.