System and Method to Locate an Anomaly of a Conductor
First Claim
1. A system (20) to locate an anomaly (22) of a conductor (24), said system (20) comprising:
- a test set (28) coupled to said conductor (24) at a location PT along said conductor (24) and configured to inject a test signal (36) into said conductor (24) at said location PT;
a probe (30) coupled to said conductor (24) at a location PP along said conductor (24) and configured to detect said test signal (36) at said location PP;
a communication link (42) configured to couple said probe (30) to said test set (28), said communication link having a propagation delay DS; and
a calculation unit (32) coupled to one of said probe (30) and said test set (28) and configured to calculate a propagation delay DTP of said conductor (24) between said location PT and said location PP in response to said propagation delay DS.
2 Assignments
0 Petitions
Accused Products
Abstract
A system (20) and method to locate an anomaly (22) of a conductor (24) is provided. The system (20) uses a test set (28) to inject a test signal (36) into the conductor (24) at a location (PT) and a probe (30) to detect the test signal (36) at a second location (PP). A communication link (42) between the probe (30) and the test set (28) has a predetermined propagation delay (DS), from which the system (20) can calculate a propagation delay (DTP) of the conductor (24) between the test set (28) and the probe (30), and a propagation delay (DPA) between the probe (30) and the anomaly (22). By varying the location (PP) of the probe (30) until the propagation delay (DPA) between the probe (30) and the anomaly (22) is substantially zero, the precise location (PA) of the anomaly (22) may be determined. The propagation velocity (VC) of the conductor (24) may also be determined. The physical distance (LPA) between the probe (30) and the anomaly (22), and hence the precise location (PA) of the anomaly (22), again may be determined.
51 Citations
24 Claims
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1. A system (20) to locate an anomaly (22) of a conductor (24), said system (20) comprising:
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a test set (28) coupled to said conductor (24) at a location PT along said conductor (24) and configured to inject a test signal (36) into said conductor (24) at said location PT;
a probe (30) coupled to said conductor (24) at a location PP along said conductor (24) and configured to detect said test signal (36) at said location PP;
a communication link (42) configured to couple said probe (30) to said test set (28), said communication link having a propagation delay DS; and
a calculation unit (32) coupled to one of said probe (30) and said test set (28) and configured to calculate a propagation delay DTP of said conductor (24) between said location PT and said location PP in response to said propagation delay DS. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A method to locate an anomaly (22) of a conductor (24), said method comprising:
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establishing a communication link (42) between a probe (30) and a test set (28);
determining a propagation delay DS of said communication link (42);
injecting a test signal (36) at a location PT along said conductor (24) using said test set (28);
detecting said test signal (36) at a location PP along said conductor (24) using said probe (30); and
calculating a propagation delay DTP between said location PT and said location PP in response to said propagation delay DS. - View Dependent Claims (14, 15, 16, 17, 18, 19)
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20. A system (20) to locate an anomaly (22) of a conductor (24), said system (20) comprising:
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a test set (28) coupled to said conductor (24) at a location PT along said conductor (24) and configured to inject a test signal (36) into said conductor (24) at said location PT, wherein said test signal (36) is one of;
a time-domain reflectometry pulse;
a digital sequence;
a spread-spectrum signal; and
a sequence of one or more sine waves;
a probe (30) coupled to said conductor (24) at a location PP and configured to detect said test signal (36) at said location PP; and
a calculation unit (32) coupled to one of said test set (28) and said probe (30) and configured to calculate a propagation delay DPA of said conductor (24) from said location PP to a location PA of said anomaly (22). - View Dependent Claims (21, 22, 23, 24)
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Specification