Method and system of characterizing a device under test
First Claim
Patent Images
1. A method of characterizing a device under test, the method comprising:
- injecting a signal into the device under test;
measuring the response to the injected signal to determine the impedance of the device under test in the frequency domain;
converting the impedance of the device under test to a time domain; and
calculating the voltage noise of the device under test based on the impedance in the time domain.
0 Assignments
0 Petitions
Accused Products
Abstract
A system and method of characterizing a device under test wherein a signal is injected into the device under test, the response to the injected signal is measured to determine the impedance of the device under test in the frequency domain, the impedance is converted to the time domain, and the voltage noise of the device under test is calculated based on the impedance of the device under test in the time domain.
-
Citations
66 Claims
-
1. A method of characterizing a device under test, the method comprising:
-
injecting a signal into the device under test;
measuring the response to the injected signal to determine the impedance of the device under test in the frequency domain;
converting the impedance of the device under test to a time domain; and
calculating the voltage noise of the device under test based on the impedance in the time domain. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
-
-
20. A method of characterizing a device under test, the method comprising:
-
determining the impedance of the device under test in the frequency domain by constructing an s-parameter matrix and calculating the real and imaginary portions of the impedance based on the s-parameter matrix;
converting the frequency domain impedance of the device under test to a time domain by performing an inverse Fourier transform on the determined complex impedance; and
calculating the voltage noise of the device under test by convolving the time domain impedance with a predetermined current in the time domain. - View Dependent Claims (21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37)
-
-
38. A system for characterizing a device under test, the system comprising:
-
an input subsystem configured to inject a signal into the device under test and measure the response of the device under test;
a routine responsive to the input subsystem for characterizing the frequency domain impedance of the device under test;
a routine configured to convert the frequency domain impedance to a time domain impedance; and
a routine configured to calculate the voltage noise of the device under test based on the time domain impedance. - View Dependent Claims (39, 40, 41, 42, 43, 44, 45, 46, 47, 48, 49, 50, 51, 52, 53, 54, 55, 56, 57, 58, 59, 60)
-
-
61. A system for characterizing a device under test, the system comprising:
-
a routine for determining the frequency domain impedance of the device under test by constructing an s-parameter matrix and calculating the real and imaginary portions of the impedance based on the s-parameter matrix;
a routine for converting the frequency domain impedance to a time domain impedance by performing an inverse Fourier transform on the complex impedance; and
a routine for calculating the voltage noise of the device under test by convolving the time domain impedance with a predetermined current. - View Dependent Claims (62, 63)
-
-
64. A system for characterizing a device under test, the system comprising:
-
an input subsystem configured to inject a signal into the device under test and to measure the response of the device under test; and
a routine for automatically determining the frequency domain impedance of the device under test by constructing an s-parameter matrix and calculating the real and imaginary portions of the impedance based on the s-parameter matrix. - View Dependent Claims (65, 66)
-
Specification