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System capable of determining applied and anodized coating thickness of a coated-anodized product

  • US 20050196522A1
  • Filed: 01/07/2005
  • Published: 09/08/2005
  • Est. Priority Date: 12/21/2000
  • Status: Active Grant
First Claim
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1. An system for forming a coated-anodized coating on at least a portion of a substrate thereby creating an coated-anodized substrate, said system including:

  • (a) a bath into which the substrate is placed to facilitate the formation of the anodized coating on at least a portion of on the substrate thereby creating the anodized substrate;

    (b) an applicator to facilitate the formation of the coating on at least a portion of the anodized substrate thereby creating the coated-anodized substrate; and

    (c) a coating thickness monitor capable of measuring the thickness of at least a portion of the coated-anodized coating on the substrate, said coating thickness monitor including;

    (i) at least one radiation source directed at at least a portion of the anodized substrate, (ii) at least one probe for capturing at least a portion of the radiation reflected and refracted by the anodized coating on the anodized substrate, the captured radiation being at least a portion of the radiation directed the anodized substrate from said radiation source, and (iii) at least one detector in communication with said at least one probe, said at least one detector capable of processing the captured radiation to allow a determination of at least the thickness of the anodized coating on the substrate.

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