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Random number test circuit, random number generation circuit, semiconductor integrated circuit, IC card and information terminal device

  • US 20050204220A1
  • Filed: 03/01/2005
  • Published: 09/15/2005
  • Est. Priority Date: 03/02/2004
  • Status: Abandoned Application
First Claim
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1. A random number test circuit comprising:

  • a counting unit configured to count number of repetitions of a certain-vasue bit in a random number sequence, the repetitions occurring in series;

    a detecting unit configured to detect a plurality of numbers corresponding to a kind of bits in the random number sequence; and

    a determining unit configured to determine whether the random number sequence is normal, based on the numbers.

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