Method and testing system for storage devices under test
First Claim
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1. A testing system for storage device under test (SDUT), comprising:
- a storage device testing subsystem configured to send testing commands, to process feedback data from said SDUT, and to send power management commands to SDUT power supply systems;
a bus; and
an application designed to generate said testing commands and said power management commands which are sent to said storage device testing subsystem.
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Abstract
A testing system for storage devices under test (SDUT) is provided. The system comprises a storage device testing subsystem configured to send testing commands, to process feedback data from said SDUT, and to send power management commands to SDUT power supply systems, a bus, and an application designed to generate the testing commands and the power management commands, controlling the power modes of the SDUT power supply systems, are sent to the storage device testing subsystem.
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Citations
4 Claims
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1. A testing system for storage device under test (SDUT), comprising:
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a storage device testing subsystem configured to send testing commands, to process feedback data from said SDUT, and to send power management commands to SDUT power supply systems;
a bus; and
an application designed to generate said testing commands and said power management commands which are sent to said storage device testing subsystem. - View Dependent Claims (2, 3, 4)
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Specification
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Current AssigneeKeqi Yuan, Meihong Hu
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Original AssigneeKeqi Yuan, Meihong Hu
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InventorsYuan, Keqi, Hu, Meihong
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Application NumberUS10/895,454Publication NumberTime in Patent OfficeDaysField of SearchUS Class Current714/742CPC Class CodesG06F 11/2221 to test input/output device...
