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Method and testing system for storage devices under test

  • US 20050204243A1
  • Filed: 01/21/2004
  • Published: 09/15/2005
  • Est. Priority Date: 01/21/2004
  • Status: Abandoned Application
First Claim
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1. A testing system for storage device under test (SDUT), comprising:

  • a storage device testing subsystem configured to send testing commands, to process feedback data from said SDUT, and to send power management commands to SDUT power supply systems;

    a bus; and

    an application designed to generate said testing commands and said power management commands which are sent to said storage device testing subsystem.

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