Measurement probe and using method for the same

• US 20050204573A1
• Filed: 12/20/2004
• Published: 09/22/2005
• Est. Priority Date: 12/24/2003
• Status: Active Grant

• Current Assignee: Matsushita Electric Industrial Company Limited (Panasonic Holdings Corporation)
• Original Assignee: Matsushita Electric Industrial Company Limited (Panasonic Holdings Corporation)
• Inventors: Kassai, Takaaki, Mochizuki, Hiroyuki, Doi, Masateru, Kubo, Keishi, Yosizumi, Keiichi
• Granted Patent: US 7,065,893 B2
• Time in Patent Office: Days
• US Class Current: 33/559
• CPC Class Codes: G01B 3/008 Arrangements for controlling the measuring force
• CPC Class Codes: G01B 5/012 Contact-making feeler heads therefor
• CPC Class Codes: G01B 7/002 Constructional details of contacts for gauges actuating one or more contacts G01B7/016 takes precedence

Abstract

A measuring probe for obtaining positional information on a measuring target face has: a movable member having a contact portion which is formed in its top and comes into contact with the measuring target face and a reflecting plane formed on its base end for reflecting a measuring light beam; a magnetic substance mounted on the movable member; a fixed member disposed in a fixed state; a bearing provided on the fixed member for supporting the movable member movably in axis line direction; and a magnetic force generating portion provided on the fixed member for generating force acting upon the magnetic substance to move the movable member in the axis line direction. The movable member is formed from a nonmagnetic material, and the bearing and the fixed member are formed from a magnetic material.

Claims

1. A measuring probe, comprising:

a housing configured to be made of a magnetic material in a cylindrical shape;

a movable member configured to be provided inside the housing along an axis line of the housing, the movable member having a contact portion at one end configured to come into contact with a measuring target face and a reflecting plane formed at the other end configured to reflect a measuring light beam, and being made of a nonmagnetic material in a rod shape;

a magnetic substance configured to be mounted on the movable member;

a bearing made of a magnetic material which is in a cylinder shape with the movable member running through at a center portion, the bearing configured to be press-fitted into the housing and support the movable member movably in axis line direction in a non-contact state;

a magnetic force generating portion configured to be in a cylinder shape with the movable member running through at a center portion and be fitted into the housing, the magnetic force generating portion having a retreat magnetic force generating portion configured to work on the magnetic substance of the movable member and move the movable member toward retreat direction along the axis line direction, and a measurement magnetic force generating potion configured to work on the magnetic substance of the movable member and move the movable member toward measuring direction along the axis line direction; and

a cover member configured to be mountable on and demountable from the housing, prevent the magnetic force generating portion and the movable member from dropping off from the housing, and be made of a magnetic material.

2. The measuring probe as defined in claim 1, further comprising a spacer configured to be provided so as to come into contact with the magnetic substance in both end portions of the magnetic force generating portion in the axis line direction, determine a moving amount of the movable member in the axis line direction, and be made of a nonmagnetic material.

3. The measuring probe as defined in claim 1, wherein the measurement magnetic force generating portion is formed from a coil whose winding number is decreased toward the measuring direction so that magnetic field strength is gradually lowered toward the one end side of the movable member and force acting upon the magnetic substance is almost uniformed regardless of a moving amount of the movable member toward the measuring direction.

4. The measuring probe as defined in claim 3, wherein a length of the measurement magnetic force generating portion along the axis line direction is equal to or larger than a length of the retreat magnetic force generating portion.

5. The measuring probe as defined in claim 4, wherein the magnetic substance has such a length that part of the magnetic substance overlaps with part of the measurement magnetic force generating portion when the movable member is positioned at a retreat position.

6. The measuring probe as defined in claim 1, wherein the measurement magnetic force generating portion has a first generating portion which is a portion coming close to the retreat magnetic force generating portion and has a length along the axis line direction equal to a length of the retreat magnetic force generating portion, and a second generating portion which is adjacent to the first generating portion and extends in the measuring direction beyond the first generating portion and is formed integrally with the first generating portion for moving the magnetic substance toward the measuring direction over the first generating portion.

7. The measuring probe as defined in claim 6, wherein a thickness of the measurement magnetic force generating portion in orthogonal direction orthogonal to the axis line direction on a boundary between the first generating portion and the second generating portion is ⅔

of a thickness of a thickest portion of the measurement magnetic force generating portion.

8. The measuring probe as defined in claim 7, wherein a thickness of a thinnest portion of the measurement magnetic force generating portion is ½

of the thickness of the thickest portion.

9. The measuring probe as defined in claim 1, further comprising a current supply unit configured to supply current to the measurement magnetic force generating portion and the retreat magnetic force generating portion, the current supply unit having:

a first supply portion configured to supply a first current to the measurement magnetic force generating portion during measurement of the measuring target face while the contact portion is in contact with the measuring target face;

a second supply portion configured to supply a second current weaker than the first current to the measurement magnetic force generating portion when the contact portion is brought into contact with the measuring target face; and

a change-over switch configured to connect the measurement magnetic force generating portion to either one of the first supply portion and the second supply portion.

10. A method for using a measuring probe which supports a movable member movably in axis line direction of the movable member, the movable member having a contact portion which comes into contact with a measuring target face at one end and having a reflecting plane formed at the other end for reflecting a measuring light beam, the method comprising:

bringing the contact portion of the movable member into contact with the measuring target face with a second current configured to bring the contact portion into contact with the measuring target face; and

after bringing the contact portion into contact, starting measurement of the measuring target face in a state the contact portion is pressed to the measuring target face with a first current configured to be stronger than the second current and press the contact portion to the measuring target face with force allowing movement in conformity to the measuring target face.

11. The method for using a measuring probe as defined in claim 10, further comprising:

storing in advance a retreat position at which the movable member is positioned with the contact portion being away from the measuring target face, and

after it is confirmed based on the stored memory that the movable member is positioned at the retreat position, bringing the contact portion into contact with the measuring target face with the second current.