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Method and system for generating test pulses to test electronic elements

  • US 20050209805A1
  • Filed: 09/08/2004
  • Published: 09/22/2005
  • Est. Priority Date: 03/19/2004
  • Status: Abandoned Application
First Claim
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1. A method for generating test pulses to test an electronic element, comprising:

  • determining a transmission clock, a serial of predetermined pulses, and a test clock corresponding to the serial of predetermined pulses, wherein said serial of predetermined pulses are sent to said electronic element and the frequency of said transmission clock is higher than the frequency of said test clock;

    generating a plurality of serial data bits, wherein said serial data bits are generated from said serial of predetermined pulses and said transmission clock;

    transforming said serial data bits into a serial data stream; and

    sending said serial data stream to said electronic element, wherein said data stream is transmitted in a specific frequency to send a specific number of bits for forming said serial of predetermined pulses according to said transmission clock.

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