Imaging device analysis systems and imaging device analysis methods

• US 20050219365A1
• Filed: 02/08/2005
• Published: 10/06/2005
• Est. Priority Date: 04/05/2004
• Status: Active Grant

• Current Assignee: Hewlett-Packard Development Company, L.P. (HP Inc.)
• Original Assignee: Hewlett-Packard Development Company, L.P. (HP Inc.)
• Inventors: Montgomery, Eric, Trovinger, Steven W., DiCarlo, Jeffrey M.
• Granted Patent: US 8,854,707 B2
• Time in Patent Office: Days
• US Class Current: 348/188
• CPC Class Codes: H04N 1/401 Compensating positionally unequal response of the pick-up or reproducing head H04N1/403 takes precedence
• CPC Class Codes: H04N 1/484 with sequential colour illumination of the original
• CPC Class Codes: H04N 17/002 for television cameras

Abstract

Imaging device analysis systems and imaging device analysis methods are described. According to one embodiment, an imaging device analysis system includes a light source configured to generate a plurality of light beams for analysis of an imaging device, wherein the light beams comprise light of a plurality of different spectral power distributions, processing circuitry coupled with the light source and configured to control the light source to generate the light beams, and an optical interface optically coupled with a light receiving member of the imaging device and configured to communicate the plurality of light beams to the light receiving member of the imaging device.

Claims

1. An imaging device analysis system comprising:

an emission assembly configured to emit light for use in analysis of an imaging device configured to generate images from received light;

a light source configured to generate the light having a plurality of spectral power distributions;

processing circuitry configured to control the generation of light by the light source; and

wherein the emission assembly comprises an optical interface which provides the light of the different spectral power distributions to the imaging device, and wherein the optical interface emits the light of individual ones of the spectral power distributions at substantially the same intensity.

2. The system of claim 1 further comprising a light sensor configured to monitor the light and wherein the processing circuitry is configured to indicate an operational status of the imaging device analysis system responsive to the monitoring.

3. The system of claim 1 wherein the optical interface uniformly emits the light at substantially the same intensity across substantially an entirety of a surface of the optical interface.

4. The system of claim 1 wherein the optical interface comprises a surface having a dimension larger than a dimension of a light receiving member of the imaging device.

5. The system of claim 1 wherein peak wavelengths of the different spectral power distributions of light are separated from immediately adjacent peak wavelengths by substantially the same amount.

6. The system of claim 1 wherein the light source comprises a plurality of light emitting devices individually configured to emit light of one of the spectral power distributions.

7. The system of claim 6 wherein the light source comprises a different number of light emitting devices for different spectral power distributions of the light to provide emission of the light of the spectral power distributions having substantially the same intensity at the optical interface.

8. The system of claim 6 wherein at least some of the light emitting devices are symmetrically arranged about a center of the light source.

9. The system of claim 6 further comprising circuitry configured to control the light emitting devices of the different spectral power distributions to provide emission of the light of the spectral power distributions having substantially the same intensity at the optical interface.

10. The system of claim 6 wherein the light emitting devices corresponding to an individual one of the spectral power distributions have spectral power distribution variations, and the emission assembly is configured to mix light received from the light emitting devices to remove the variations and to emit a plurality of light beams individually having only a substantially single spectral power distribution.

11. The system of claim 1 wherein the processing circuitry is configured to control sequential emission of the light of the different spectral power distributions.

12. The system of claim 1 wherein the processing circuitry is configured to communicate control signals to the imaging device to control operations of the imaging device to implement the analysis of the imaging device.

13. The system of claim 12 wherein the processing circuitry is configured to communicate the control signals to synchronize image capture operations of the imaging device with the emission of light from the optical interface.

14. The system of claim 13 wherein the processing circuitry is configured to control sequential emission of the light of the different spectral power distributions and the control signals control the imaging device to capture a plurality of images of the light having the different spectral power distributions.

15. The system of claim 1 further comprising a housing configured to house the light source and the emission assembly, and wherein the processing circuitry is external of the housing.

16. An imaging device analysis system comprising:

a light source configured to generate a plurality of light beams for analysis of an imaging device, wherein the light beams comprise light of a plurality of different spectral power distributions;

processing circuitry coupled with the light source and configured to control the light source to generate the light beams; and

an optical interface optically coupled with a light receiving member of the imaging device and configured to communicate the plurality of light beams to the light receiving member of the imaging device.

17. The system of claim 16 wherein the processing circuitry is configured to control the light source to generate the light beams in a sequence and the optical interface is configured to pass the light of the light beams for communication to the light receiving member of the imaging device.

18. The system of claim 16 wherein the processing circuitry is configured to control at least one operation of the imaging device to implement the analysis of the imaging device.

19. The system of claim 16 wherein the processing circuitry is configured to synchronize image capture operations of the imaging device with the generation of the light beams.

20. The system of claim 16 wherein the optical interface is configured to communicate the light beams to the light receiving member of the image device without communication of light to the light receiving member which was not generated by the light source.

21. The system of claim 16 wherein the optical interface is configured to communicate individual ones of the light beams to substantially an entirety of the light receiving member of the imaging device.

22. The system of claim 16 further comprising circuitry configured to provide communication of the light beams by the optical interface of substantially the same intensity.

23. The system of claim 16 wherein the light source comprises, for individual ones of the light beams, a plurality of light emitting devices configured to generate light of the respective light beam, and further comprising an emission assembly configured to mix the light of the light emitting devices of the respective light beam to form the respective light beam having only a substantially single spectral power distribution.

24. The system of claim 16 wherein the optical interface uniformly emits, for individual ones of the light beams, the respective light at substantially the same intensity across substantially an entirety of a surface of the optical interface.

25. The system of claim 16 wherein the optical interface uniformly emits, for individual ones of the light beams, the respective light having substantially the same spectral power distribution across substantially an entirety of a surface of the optical interface.

26. An imaging device analysis system comprising:

means for generating a plurality of light beams for analysis of an imaging device, wherein the light beams comprise light of a plurality of different spectral power distributions;

means for controlling the means for generating the light beams; and

means for optically communicating individual ones of the light beams to an entirety of a light receiving means of the imaging device.

27. The system of claim 26 wherein the light receiving member comprises a lens surface and the means for optically communicating comprises means for optically communicating individual ones of the light beams to substantially an entirety of the lens surface.

28. The system of claim 26 wherein the means for optically communicating comprises means for optically communicating the light beams to the light receiving means at substantially the same intensity.

29. An imaging device analysis method comprising:

providing an analysis system;

optically coupling an imaging device to be analyzed with the analysis system;

generating a plurality of light beams of a plurality of different spectral power distributions;

controlling the generating using processing circuitry; and

optically communicating the light beams to the imaging device optically coupled with the analysis system for use in analyzing the imaging device.

30. The method of claim 29 wherein the optically communicating comprises optically communicating the light beams of the different spectral power distributions to the imaging device at substantially the same intensity.

31. The method of claim 29 further comprising monitoring the light beams and indicating an operational status of the analysis system responsive to the monitoring.

32. The method of claim 29 wherein the optically coupling comprises optically coupling via an optical interface of an imaging device analysis system, and wherein the optically communicating comprises optically communicating individual ones of the light beams having a substantially uniform intensity across a surface of the optical interface.

33. The method of claim 29 wherein the generating comprises generating using a different number of light emitting devices for respective ones of the light beams to provide the light beams of the different spectral power distributions having substantially the same intensity.

34. The method of claim 29 wherein the generating comprises generating using a plurality of light emitting devices corresponding to different ones of the light beams, and driving the light emitting devices using different currents to provide the light beams of the different spectral power distributions having substantially the same intensity.

35. The method of claim 29 wherein the generating comprising generating individual ones of the light beams using a plurality of light emitting devices, and further comprising, for individual ones of the light beams, mixing light of respective ones of the light emitting devices before the optically communicating.

36. The method of claim 35 wherein the mixing comprises, for an individual one of the light beams, mixing to provide the light beam of a single spectral power distribution.

37. The method of claim 29 wherein the optically communicating comprises sequentially optically communicating the light beams to the imaging device.

38. The method of claim 29 further comprising communicating control signals from the analysis system to the imaging device to implement analysis of the imaging device.

39. The method of claim 29 further comprising synchronizing image capture operations of the imaging device with the optically communicating of the plurality of light beams.