Slit confocal microscope and method

• US 20050225849A1
• Filed: 04/05/2004
• Published: 10/13/2005
• Est. Priority Date: 04/05/2004
• Status: Abandoned Application

• Current Assignee: Fujifilm Electronic Imaging Ltd. (Fujifilm Holdings Corporation)
• Original Assignee: Fujifilm Electronic Imaging Ltd. (Fujifilm Holdings Corporation)
• Inventors: Gouch, Martin Philip
• Application Number:
  US10/818,585
• Publication Number:
  US 20050225849A1
• Time in Patent Office: Days
• US Class Current: 359/385
• CPC Class Codes: G02B 21/0024 Confocal scanning microscopes (CSOMs) or confocal "macroscopes"; Accessories which are not restricted to use with CSOMs, e.g. sample holders

Abstract

A slit confocal microscope comprises a linear light source; a detection system; and a focusing system for focusing light from the source onto a sample and focusing returning light onto the detection system. The detection system comprises a one-dimensional, linear array of detectors onto which light from the sample is focused directly or indirectly by the focusing system. A control system causes the linear array of detectors to integrate light from a corresponding line of pixels in the sample.

Claims

1. A slit confocal microscope comprising a linear light source;

a detection system; and

a focusing system for focusing light from the source onto a sample and focusing returning light onto the detection system, wherein the detection system comprises a one-dimensional, linear array of detectors onto which light from the sample is focused directly or indirectly by the focusing system, and a control system for causing the linear array of detectors to integrate light from a corresponding line of pixels in the sample.

2. A microscope according to claim 1, further comprising a mask defining a slit at the focus of light from the sample.

3. A microscope according to claim 2, further comprising a further focusing system for focusing the slit onto the linear array of detectors.

4. A microscope according to claim 1, wherein the linear array of detectors is located at the focus of the focusing system.

5. A microscope according to claim 1, further comprising means for moving the array of detectors relative to a sample in an image plane of the focusing system.

6. A microscope according to claim 1, wherein the detection system comprises more than one linear array of detectors, the arrays being substantially parallel with one another, each array of detectors being sensitive to a respectively different colour.

7. A microscope according to claim 6, wherein the light source is adapted to generate more than one beam of respectively different colours, the focusing system focusing returning light to respectively different focal locations, and wherein the detecting system is movable to bring each array to the corresponding focal location of the focussing system.

8. A microscope according to claim 1, wherein the detection system comprises a single linear array of detectors, and the linear light source is adapted to generate lines of different colours alternately, the detection system being sensitive to all colours generated by the linear light source.

9. A slit confocal microscope according to claim 6, wherein the colours comprise red, green and blue.

10. A microscope according to claim 1, wherein the linear array of detectors comprises a CCD array.

16. A microscope according to claim 2, further comprising means for moving the slit relative to a sample in an image plane of the focusing system.

17. A microscope according to claim 2, further comprising means for moving the array of detectors and the slit relative to a sample in an image plane of the focusing system.

18. A slit confocal microscope according to claim 7, wherein the colours comprise red, green and blue.

19. A slit confocal microscope according to claim 8, wherein the colours comprise red, green and blue.

11. A method of operating a slit confocal microscope comprising a linear light source;

a detection system; and

a focusing system for focusing light from the source onto a sample and focusing returning light onto the detection system, wherein the detection system comprises a one-dimensional, linear array of detectors onto which light from the sample is focused directly or indirectly by the focusing system, and a control system for causing the linear array of detectors to integrate light from a corresponding line of pixels in the sample, the method comprising;

a) illuminating a line of pixels from the sample, light from the sample being focused onto the linear array of detectors;

b) integrating the incident light on the detectors corresponding to the line of pixels; and

,

c) repeating steps a) and b) with the same linear array for successive lines of pixels on the sample.

12. A method according to claim 11, further comprising causing relative movement between all or part of the microscope and the sample to illuminate different lines of pixels on the sample.

13. A method according to claim 11, the method comprising carrying out steps a)-c) for one colour and then repeating steps a)-c) for the same line of pixels but when illuminated with one or more further colours.

14. A method according to claim 11, the method comprising, for each line of pixels, carrying out steps a) and b) for each of two or more colours before carrying out step c).

15. A method according to claim 11 comprising causing continuous relative movement between the sample and the detection system such that successive lines of pixels on the sample are focused on to the detection system;

repeatedly illuminating the sample with different colours at a rate such that a line of pixels illuminated with one colour overlaps a line of pixels illuminated with the next colour; and

, for each illuminated line of pixels integrating the incident light on the detectors.