Label-free high-throughput optical technique for detecting biomolecular interactions

• US 20050227374A1
• Filed: 11/12/2004
• Published: 10/13/2005
• Est. Priority Date: 10/30/2000
• Status: Active Grant

• Current Assignee: X-Body Incorporated (Bristol-Myers Squibb Company)
• Original Assignee: Sru Biosystems Incorporated
• Inventors: Cunningham, Brian T.
• Granted Patent: US 7,422,891 B2
• Time in Patent Office: Days
• US Class Current: 436/518
• CPC Class Codes: B01L 3/5085 for multiple samples, e.g. microtitration plates
• CPC Class Codes: G01N 21/253 for batch operation, i.e. multisample apparatus analytical automats G01N35/00
• CPC Class Codes: G01N 21/4788 Diffraction for sizing particles G01N15/0205
• CPC Class Codes: G01N 21/7743 the reagent-coated grating coupling light in or out of the waveguide
• CPC Class Codes: G01N 33/54373 involving physiochemical end-point determination, e.g. wave-guides, FETS, gratings
• CPC Class Codes: G02B 5/1809 with pitch less than or comparable to the wavelength
• CPC Class Codes: Y10T 436/24 Nuclear magnetic resonance, electron spin resonance or other spin effects or mass spectrometry

Abstract

Methods and compositions are provided for detecting biomolecular interactions. The use of labels is not required and the methods can be performed in a high-throughput manner. The invention also provides optical devices useful as narrow band filters.

Claims

1-104. -104. (canceled)

105. An apparatus for detecting the presence and concentration of matter in contact with a surface structure optical filter by observation of a shift in the wavelength of filtered electromagnetic waves, the apparatus comprising:

a first substrate having a surface relief structure containing at least one dielectric body with physical dimensions smaller than the wavelength of the filtered electromagnetic waves, such structures repeated in a linear array or two dimensional array covering at least a portion of the surface of the first substrate, said surface relief structures of the substrate being composed of or immersed in a material sufficient to form a guided mode resonance filter; and

a sample material deposited on the surface relief structures, thereby producing an observable shift in the wavelength of the filtered electromagnetic waves in proportion to the amount of sample material accumulated.

106. An apparatus as in claim 105, wherein the spacing of the surface relief structures in the array is substantially the same and less than the wavelength of the filtered electromagnetic waves.

107. An apparatus as in claim 105, wherein the individual dielectric bodies in the surface texture are circularly shaped.

108. An apparatus as in claim 105, wherein the propagation direction of electromagnetic waves resonantly reflected from the surface structures, or transmitted through the substrate, is not materially altered by the accumulation of sample material on the surface structures.

119. An apparatus as in claim 105, wherein the individual dielectric bodies comprising the surface texture have cylindrical, elliptical, square, rectangular, or hexagonal cross sectional profiles.

120. An apparatus as in claim 105, wherein in the individual dielectric bodies comprising the surface texture are lines with a width less than the wavelength of the filtered electromagnetic waves and length substantially equivalent to the apparatus dimension, repeated in an array with a spacing less than the wavelength of the filtered electromagnetic waves.

121. An apparatus as in claim 105, wherein the substrate comprises glass or plastic.

122. An apparatus as in claim 105, wherein the dielectric bodies comprising the surface relief structures are comprised of a material selected from the group consisting of zinc sulfide, titanium oxide, tantalum oxide and silicon nitride.

123. An apparatus as in claim 105, wherein the surface relief structure is a conductive material.

124. An apparatus as in claim 105 further comprising a conductive material to allow an electric field to be applied.

125. An apparatus as in claim 105, further comprising a second resonant structure coupled to the first substrate to provide a static reference signal which can be used to determine the difference between a shifted signal due to a deposited material layer and a shifted signal due to varying ambient conditions.

126. An apparatus as in claim 105, wherein the sample material comprises an organic substance.

127. An apparatus as in claim 105, wherein the sample material comprises an inorganic substance.

109. An apparatus for detecting the concentration of matter in a material layer by observation of a shift in the wavelength of filtered electromagnetic waves, the apparatus comprising:

a substrate having a surface relief structure containing at least one dielectric body with physical dimensions smaller than the wavelength of the filtered electromagnetic waves, such structures repeated in a linear array or two dimensional array covering at least a portion of the surface of the substrate;

a material coating the surface relief structures of the substrate to form a guided mode resonance filter;

and a top material layer which adheres or chemically binds to a sample material thereby producing an observable shift in the wavelength of the filtered electromagnetic waves.

110. An apparatus as in claim 109, wherein the spacing of the surface relief structures in the array is substantially the same and less than the wavelength of the filtered electromagnetic waves.

111. An apparatus as in claim 109, wherein the surface relief structure is composed of a conductive material suitable for applying an electric field.

112. An apparatus as in claim 109, further comprising a second resonant structure coupled to the first substrate to provide a static reference signal which can be used to determine the difference between a shifted signal due to a deposited material layer and a shifted signal due to varying ambient conditions.

113. An apparatus as in claim 109, wherein the individual dielectric bodies comprising the surface texture have cylindrical, elliptical, square, rectangular, or hexagonal cross sectional profiles.

114. An apparatus as in claim 109, wherein the individual dielectric bodies in the surface texture are lines with a width less than the wavelength of the filtered electromagnetic waves and a length substantially equivalent to the apparatus dimension, repeated in an array with a spacing less than the wavelength of the filtered electromagnetic waves.

115. An apparatus as in claim 109, wherein the substrate comprises glass or plastic.

116. An apparatus as in claim 109, wherein the dielectric bodies comprising the surface relief structures are comprised of a material selected from the group consisting of zinc sulfide, titanium oxide, tantalum oxide and silicon nitride.

117. An apparatus as in claim 109, wherein the sample material comprises an organic substance.

118. An apparatus as in claim 109, wherein the sample material comprises an inorganic substance.