Method and structure for variable pitch microwave probe assembly
First Claim
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1. A coplanar waveguide (CPW) probe assembly, comprising:
- at least one center probe element, each having a respective center probe contact point; and
at least one peripheral probe element, each having a respective peripheral contact point, wherein a pitch of said at least one center contact and said at least one peripheral contact is adjustable.
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Abstract
A coplanar waveguide (CPW) probe includes at least one center probe element, each having a respective center probe contact point and at least one peripheral probe element, each having a respective peripheral contact point. The pitch between the at least one center contact point and the at least one peripheral contact point is adjustable.
24 Citations
25 Claims
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1. A coplanar waveguide (CPW) probe assembly, comprising:
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at least one center probe element, each having a respective center probe contact point; and
at least one peripheral probe element, each having a respective peripheral contact point, wherein a pitch of said at least one center contact and said at least one peripheral contact is adjustable. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A test probe assembly comprising:
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a micro-coaxial cable having at least one center conductor and a conductive outer wall; and
a probe tip section comprising at least one center contact, each respectively extending from one of said at least one center conductor, and at least one peripheral contact, each electrically connected to said conductive outer wall, wherein a pitch between said at least one center contact and said at least one peripheral contact is adjustable. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16, 17)
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18. A method of testing an electronic circuit, said method comprising:
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making an adjustment of a contact pitch on an air coplanar waveguide (CPW) probe having an adjustable contact pitch; and
placing contacts of said CPW probe in contact with test points of said electronic circuit. - View Dependent Claims (19, 20, 21, 22)
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23. A method of fabricating a micro-coaxial probe assembly, said method comprising:
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attaching at least one peripheral probe tip element to an outer wall of a micro-coax assembly having at least one center conductor, said center conductor being extended to serve as an inner probe element for testing a test point, said at least one peripheral probe tip element being attached to said outer wall a predetermined distance from an end of said inner probe element to be used to contact a test point; and
incorporating an interface on said outer wall for a mechanism that allows said at least one peripheral probe tip element to be adjusted in separation from said at least one center conductor. - View Dependent Claims (24, 25)
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Specification