Method for characterizing cells with consideration for bumped waveform and delay time calculation method for semiconductor integrated circuits using the same

• US 20050232066A1
• Filed: 04/19/2005
• Published: 10/20/2005
• Est. Priority Date: 04/19/2004
• Status: Abandoned Application

• Current Assignee: Matsushita Electric Industrial Company Limited (Panasonic Holdings Corporation)
• Original Assignee: Matsushita Electric Industrial Company Limited (Panasonic Holdings Corporation)
• Inventors: Amekawa, Naoki, Iwanishi, Nobufusa, Ishibashi, Noriko
• Application Number:
  US11/108,696
• Publication Number:
  US 20050232066A1
• Time in Patent Office: Days
• US Class Current: 365/189.30
• CPC Class Codes: G06F 30/367 Design verification, e.g. using simulation, simulation program with integrated circuit emphasis [SPICE], direct methods or relaxation methods

Abstract

An effective input terminal capacitance which is effectively equivalent to a cell in which a waveform distortion is caused due to the Miller effect and a drive load connected to the cell is calculated in advance, and the cell and the drive load are replaced by the calculated effective input terminal capacitance, while considering that the Miller effect is caused according to the size of the drive load driven by a delay time calculation subject circuit, such as a cell, or the like, and a distortion occurs in input and output waveforms of the delay time calculation subject circuit due to the Miller effect. Thereafter, a circuit simulation is carried out using the effective input terminal capacitance. A resultant effective input terminal capacitance value is characterized as a function of an input slope waveform and the drive load and converted to table data.

Claims

1. A cell characteristic characterization method for characterizing the characteristics of a cell to which a predetermined drive load is connected, where an input waveform to the cell has a distortion due to the Miller effect, the method comprising:

an effective input terminal capacitance calculation step of calculating an effective input terminal capacitance of the cell which corresponds to a case where the input waveform input to the characterization subject cell to which the drive load is connected results in a distorted waveform which is delayed from the input waveform by a predetermined delay time due to the Miller effect; and

a storage step of storing the effective input terminal capacitance calculated at the effective input terminal capacitance calculation step as a function of the input waveform and the value of the drive load.

10. An input waveform calculation method for calculating a distorted input signal waveform of a cell which is distorted due to the Miller effect using the cell characteristic characterization method of claim 1, an input side of the cell being connected to a line, an output side of the cell being connected to a drive load, the method comprising:

an input terminal capacitance calculation step of referring to the function of the cell characteristic characterization method of claim 1 to calculate an effective input terminal capacitance which corresponds to an input waveform of the waveform calculation subject cell which is obtained before the distortion and a value of the drive load; and

a waveform calculation step of calculating an input waveform of the waveform calculation subject cell which is obtained after the distortion based on an output signal waveform of the line connected to the input side of the input waveform calculation subject cell and a load capacitance obtained by adding the capacitance of the line connected to the input side of the waveform calculation subject cell to the calculated effective input terminal capacitance.

2. A cell characteristic characterization method, comprising:

an input slope waveform generation step of generating an input slope waveform;

an input bump waveform generation step of generating an input bump waveform;

a circuit simulation step of inputting an input waveform which includes the input slope waveform and the input bump waveform superimposed thereon to the characterization subject cell and measuring an output waveform of the characterization subject cell which corresponds to the input waveform input to the characterization subject cell;

a slope waveform/bump waveform separation step of separating the measured output waveform of the characterization subject cell into an output slope waveform and an output bump waveform; and

a storage step of storing the output slope waveform and the output bump waveform as a function of the input slope waveform and the input bump waveform.

3. The method of claim 2, wherein each of the input bump waveform and the output bump waveform is defined by a waveform transition time of the slope waveform, a bump waveform height, a bump waveform width, a bump area, a time interval which elapses till the bump waveform reaches a peak, and a timing at which the bump waveform is superimposed on the slope waveform.

5. A delay time calculation method for calculating a delay time of a semiconductor integrated circuit with consideration for a waveform distortion using the cell characteristic characterization method of claim 2, the semiconductor integrated circuit including a plurality of cells connected by a plurality of lines, the method comprising:

a drive load/input waveform extraction step of extracting an input waveform and a value of a drive load as to a delay time calculation subject cell selected from the plurality of cells;

a distortion-generating pattern determination step of referring to the function of the cell characteristic characterization method of claim 2 to determine whether or not a pattern of the delay time calculation subject cell which corresponds to the extracted input waveform and the extracted value of the drive load generates a distortion in the input waveform or the output waveform;

if the pattern is not determined to be a pattern which generates a distortion at the distortion-generating pattern determination step, a gate-level delay time calculation step of performing a gate-level delay time calculation process on the delay time calculation subject cell; and

if the pattern is determined to be a pattern which generates a distortion at the distortion-generating pattern determination step, a transistor-level delay time calculation step of performing a transistor-level delay time calculation process on the delay time calculation subject cell.

6. The delay time calculation method of claim 5, further comprising a waveform distortion detection step, which includes

detecting whether or not a waveform distortion occurs in an input waveform and an output waveform of the delay time calculation subject cell after the delay time calculation at the transistor-level delay time calculation step, and

if a waveform distortion occurs, repeating a transistor-level delay time calculation at the transistor-level delay time calculation step till the occurrence of the waveform distortion is stopped.

9. A delay time calculation method for calculating a delay time of a semiconductor integrated circuit with consideration for a waveform distortion using the cell characteristic characterization method of claim 2, the semiconductor integrated circuit including a plurality of instances connected by a plurality of nets, the method comprising:

a slope waveform/bump waveform separation step of separating an input waveform including an superposed input bump waveform, which is input to a delay time calculation subject instance selected from the plurality of instances, into an input slope waveform on which the input bump waveform is not superimposed and the input bump waveform;

a library reference step of referring to the function of the cell characteristic characterization method of claim 2 to obtain an output slope waveform and an output bump waveform of the delay time calculation subject instance which correspond to the input slope waveform and the input bump waveform and obtain as an output waveform of the delay time calculation subject instance an output waveform formed by the output slope waveform and the output bump waveform superimposed thereon; and

if a bump waveform occurs due to an external factor in a subsequent net connected to an output side of the delay time calculation subject instance, a net waveform calculation step of inputting information of the bump waveform and superimposing the bump waveform on an output waveform of the delay time calculation subject instance to calculate an output waveform of the subsequent net.

4. A cell characteristic characterization method for characterizing a characterization subject cell to which a predetermined drive load is connected, a cell which has a small driving capacity being connected to an input side of the characterization subject cell, the method comprising:

a waveform distortion detection step which includes

inputting an input waveform to the small driving capacity cell, and

detecting the presence/absence of a waveform distortion in an input waveform and an output waveform of the characterization subject cell as a result of the input waveform to the small driving capacity cell; and

a storage step of storing the presence/absence of the waveform distortion in the input waveform and the output waveform of the characterization subject cell as a function or table of the input waveform of the characterization subject cell and the value of the drive load.

7. A delay time calculation method for calculating a delay time of a semiconductor integrated circuit with consideration for a waveform distortion, the semiconductor integrated circuit including a plurality of instances connected by a plurality of nets, the method comprising:

a first delay time calculation step of calculating a delay time of all the instances and a line delay time of all the nets and signal waveforms at input and output terminals of all the instances;

an instance input signal waveform calculation step of obtaining a distorted input signal waveform which is distorted due to the Miller effect of a delay time calculation subject instance selected from the plurality of instances, the instance input signal waveform calculation step including

inputting a variable input terminal capacitance value of the delay time calculation subject instance which is determined according to the presence/absence of a distortion caused by the Miller effect in an input waveform,

representing the variable input terminal capacitance value as a coupling capacitance between input and output terminals of the delay time calculation subject instance, and

calculating crosstalk using a net connected to the output terminal of the delay time calculation subject instance as an aggressor and a net connected to the input terminal of the delay time calculation subject instance as a victim;

an instance output signal waveform transfer step of obtaining a distorted output signal waveform of the delay time calculation subject instance, the instance output signal waveform transfer step including

inputting the distorted input signal waveform calculated at the instance input signal waveform calculation step, and

calculating a signal waveform transfer between the input and output terminals of the delay time calculation subject instance; and

a second delay time calculation step which includes

calculating a delay time of the delay time calculation subject instance based on the distorted input signal waveform and the distorted output signal waveform of the delay time calculation subject instance, and

allowing transfer of the distorted output signal waveform to calculate a delay time of a subsequent instance and a line delay time of a subsequent net.

8. A delay time calculation method for calculating a delay time of a semiconductor integrated circuit with consideration for a waveform distortion, the semiconductor integrated circuit including a plurality of instances connected by a plurality of nets, the method comprising:

a first delay time calculation step of calculating a delay time of all the instances and a line delay time of all the nets and signal waveforms at input and output terminals of all the instances;

an instance input signal waveform calculation step of obtaining a distorted input signal waveform which is distorted due to the Miller effect of a delay time calculation subject instance selected from the plurality of instances, the instance input signal waveform calculation step including

inputting a variable input terminal capacitance value of the delay time calculation subject instance which is determined according to the presence/absence of a distortion caused by the Miller effect in an input waveform,

representing the variable input terminal capacitance value as a coupling capacitance between input and output terminals of the delay time calculation subject instance, and

calculating crosstalk using a net connected to the output terminal of the delay time calculation subject instance as an aggressor and a net connected to the input terminal of the delay time calculation subject instance as a victim;

an instance output signal waveform calculation step of obtaining a distorted output signal waveform which is distorted due to the Miller effect of the delay time calculation subject instance, the instance output signal waveform calculation step including

inputting the variable input terminal capacitance value,

representing the variable input terminal capacitance value as a coupling capacitance between the input and output terminals of the delay time calculation subject instance, and

calculating crosstalk using a net connected to the input terminal of the delay time calculation subject instance as an aggressor and a net connected to the output terminal of the delay time calculation subject instance as a victim;

a second delay time calculation step which includes

calculating a delay time of the delay time calculation subject instance based on the distorted input signal waveform and the distorted output signal waveform of the delay time calculation subject instance, and

allowing transfer of the distorted output signal waveform to calculate a delay time of a subsequent instance and a line delay time of a subsequent net.

11. A delay time calculation method for calculating a delay time of a semiconductor integrated circuit with consideration for a waveform distortion, the semiconductor integrated circuit including a plurality of instances connected by a plurality of nets, the method comprising:

a delay time calculation step which includes

calculating a delay time of all the instances and a line delay time of all the nets, signal waveforms at input and output terminals of all the instances, and an effective input terminal capacitance of all the instances,

inputting a Miller effect-causing condition which includes an input signal waveform and an effective input terminal capacitance,

collating the input signal waveform and the effective input terminal capacitance calculated for each instance with the Miller effect-causing condition,

listing an instance in which the Miller effect is caused in an input signal to output the list as a Miller effect-caused instance list;

a static timing analysis step which includes

assigning the delay time calculated at the delay time calculation step to a netlist to perform a static timing analysis,

determining whether or not a timing of each path satisfies a timing design specification,

if the timing design specification is not satisfied, storing a difference between a timing of the unsatisfactory path and the timing design specification as slack information;

a Miller effect-caused instance extraction step which includes

collating an instance included in a path which is determined not to satisfy the timing design specification at the static timing analysis step with the Miller effect-caused instance list,

if the instance included in the path is included in the Miller effect-caused instance list, calculating a delay variation caused due to the Miller effect of the instance to output the calculated delay variation as a path delay variation report; and

a timing redetermination step which includes

collating the slack information of the path which is determined not to satisfy the timing design specification with the path delay variation report, and

if the timing design specification is satisfied with the delay variation caused due to the Miller effect, redetermining that the path satisfies the timing design specification.

12. A delay time calculation method for calculating a delay time of a semiconductor integrated circuit with consideration for a waveform distortion, the semiconductor integrated circuit including a plurality of instances connected by a plurality of nets, the method comprising:

a static timing analysis step which includes

inputting a netlist, a delay time of the plurality of instances, and a line delay time of the plurality of nets, and

assigning the delay time and the line delay time to the netlist to perform a static timing analysis;

a timing MET determination step of determining whether or not a result of the timing analysis at the static timing analysis step satisfies a timing design specification;

if it is determined at the timing MET determination step that the timing design specification is not satisfied, a circuit modification step of performing a circuit modification including change of the instance size or rearrangement of lines based on layout information for timing correction;

a delay time calculation step which includes

calculating a delay time of all the instances and a line delay time of all the nets after the circuit modification of the circuit modification step, and

after the calculation, returning to the static timing analysis step;

if it is determined at the timing MET determination step that the timing design specification is satisfied, a Miller effect-caused instance extraction step of extracting an instance included in a path in which the Miller effect occurs based on a Miller effect-causing condition but the timing fails to satisfy the timing design specification as a result of the occurrence of the Miller effect; and

a circuit modification method determination step which includes

determining a circuit modification method from a method for modifying the Miller effect-caused instance extracted at the Miller effect-caused instance extraction step and a method for modifying an instance which is a factor that causes the Miller effect, and

returning to the circuit modification step.

13. The delay time calculation method of claim 12, wherein the circuit modification method determination step includes:

a Miller effect-caused instance modification method presentation step of presenting a circuit modification method for changing a cell size of an instance in which the Miller effect is caused to a cell size such that the Miller effect is removed;

a Miller effect-causing factor instance modification method presentation step of presenting a circuit modification method for changing a cell size of an instance which generates a signal waveform that causes the Miller effect to a cell size such that the Miller effect is removed; and

an optimum modification method selection step of comparing the two circuit modification methods presented at the two modification method presentation steps to select therefrom a circuit modification method which causes minimum area damage.