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Advanced optics for rapidly patterned laser profiles in analytical spectrometry

  • US 20050242277A1
  • Filed: 02/11/2005
  • Published: 11/03/2005
  • Est. Priority Date: 02/12/2004
  • Status: Active Grant
First Claim
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1. A method for inspecting a sample comprising the steps of:

  • providing a wavefront of photons from a photon source;

    transforming the wavefront of photons into a uniform intensity profile;

    selectively varying the spatial distribution of photons within said uniform intensity profile to construct a photon pattern;

    focusing said photon pattern on at least a portion of a sample; and

    , desorbing, and optionally ionizing, at least a portion of said sample.

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