Advanced optics for rapidly patterned laser profiles in analytical spectrometry
First Claim
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1. A method for inspecting a sample comprising the steps of:
- providing a wavefront of photons from a photon source;
transforming the wavefront of photons into a uniform intensity profile;
selectively varying the spatial distribution of photons within said uniform intensity profile to construct a photon pattern;
focusing said photon pattern on at least a portion of a sample; and
, desorbing, and optionally ionizing, at least a portion of said sample.
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Abstract
The present invention is directed to a novel arrangement of optical devices for the rapid patterning of laser profiles used for desorption and/or ionization sources in analytical mass spectrometry. Specifically, the new optical arrangement provides for a user-defined laser pattern at the sample target that can be quickly changed (on a microsecond timescale) to different dimensions (or shapes) for subsequent laser firings.
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Citations
50 Claims
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1. A method for inspecting a sample comprising the steps of:
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providing a wavefront of photons from a photon source;
transforming the wavefront of photons into a uniform intensity profile;
selectively varying the spatial distribution of photons within said uniform intensity profile to construct a photon pattern;
focusing said photon pattern on at least a portion of a sample; and
,desorbing, and optionally ionizing, at least a portion of said sample. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
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20. An apparatus for inspecting a sample, said apparatus comprising:
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a source for providing a wavefront of photons, said source having sufficient power to desorb, and optionally ionize, at least a portion of said sample;
means for transforming the wavefront of photons into a uniform intensity profile, said means for transforming being fluidly coupled to said source;
means for selectively varying the spatial distribution of photons within said uniform intensity profile to construct a photon pattern, said means for selectively varying being fluidly coupled to said means for transforming; and
,means for focusing said photon pattern onto said sample, said means for focusing being fluidly coupled to said means for selectively varying. - View Dependent Claims (21, 22, 23, 24, 25, 26, 27, 28, 29)
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30. A method for inspecting a sample comprising the steps of:
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providing a plurality of wavefronts of photons from a plurality of photon sources;
transforming said plurality of wavefronts into a plurality of uniform intensity profiles;
selectively varying the spatial distribution of photons within said uniform intensity profiles to construct a plurality of photon patterns;
focusing said plurality photon patterns onto a sample; and
,desorbing, and optionally ionizing, at least a portion of said sample to form a plurality of packets of desorbed and optionally ionized material. - View Dependent Claims (31, 32, 33, 34, 35, 36, 37, 38, 39, 40, 41, 42, 43, 44, 45, 46, 47, 48, 49)
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50. A method for inspecting a sample comprising the steps of:
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providing a wavefront of photons from a photon source;
transforming the wavefront of photons into a uniform intensity profile;
selectively varying the spatial distribution of photons within said uniform intensity profile to construct a photon pattern;
focusing said photon pattern on at least a portion of a sample;
desorbing, and optionally ionizing, at least a portion of said sample to form a desorbed sample; and
,thereafter performing mass spectrometry, or ion mobility spectrometry, or a combination of ion mobility spectrometry and mass spectrometry on at least a portion of said desorbed and optionally ionized sample.
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Specification